2018
DOI: 10.1021/acsphotonics.8b00283
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High Internal Quantum Efficiency of Nonpolar a-Plane AlGaN-Based Multiple Quantum Wells Grown on r-Plane Sapphire Substrate

Abstract: An internal quantum efficiency (IQE) as high as 39% was achieved with the nonpolar a-plane AlGaN-based multiple quantum wells (MQWs) grown on the r-plane sapphire substrate with metal organic chemical vapor deposition technology. Evident fourth order X-ray diffraction satellite peak and intense MQW-related exciton emission peak at a wavelength of 279.2 nm were observed, implying the successful growth of high quality nonpolar aplane AlGaN-based MQWs. It was found that the employment of the trimethyl-aluminum (T… Show more

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Cited by 34 publications
(19 citation statements)
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(40 reference statements)
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“…Therefore, achieving a high-quality epitaxy of AlN films is of particular importance to ensure the excellent performance of DUV photoelectric devices 11 13 . Currently, due to the lack of large-size and low-price homogenous substrates, the optimal choice to grow AlN films is usually to perform heteroepitaxial growth on sapphire 14 17 . Unfortunately, due to the inherent lattice and thermal expansion coefficient (TEC) mismatches between AlN and sapphire substrate 18 , 19 , even the well-known two-step epitaxy method or epitaxial lateral overgrowth (ELO) technology still inevitably introduces a variety of crystal defects into AlN epilayer 20 22 .…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, achieving a high-quality epitaxy of AlN films is of particular importance to ensure the excellent performance of DUV photoelectric devices 11 13 . Currently, due to the lack of large-size and low-price homogenous substrates, the optimal choice to grow AlN films is usually to perform heteroepitaxial growth on sapphire 14 17 . Unfortunately, due to the inherent lattice and thermal expansion coefficient (TEC) mismatches between AlN and sapphire substrate 18 , 19 , even the well-known two-step epitaxy method or epitaxial lateral overgrowth (ELO) technology still inevitably introduces a variety of crystal defects into AlN epilayer 20 22 .…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, the AlN and AlGaN buffer layers were grown with a two-way pulsed-flows growth technology [14]. The 5-period of nonpolar AlGaN MQWs were grown with the identical growth method and parameters as our previously reported and the thickness of quantum barriers and quantum wells were confirmed to be 10.5 and 3.9 nm both by the X-ray diffraction (XRD) fitting results and transmission electron microscope (TEM) measurements [16]. Two samples were grown with the identical growth parameters except for the duration of dual nitridation process.…”
Section: Methodsmentioning
confidence: 99%
“…TDPL spectra measured with the temperature varied from 15.5 to 300 K for sample MA (a) and from 13.8 to 300 K for sample MB (b); TRPL decay curves of MQWs and BSFs emission for samples MA and MB measured at 13 K (c).Fig. 4(b)reproduced from Ref [16],. with permission of ACS Publications.…”
mentioning
confidence: 88%
“…e nonpolar plane reduces quantumconfined Stark effect (QCSE) from the spontaneous and piezoelectric polarization [12,13]. Zhao et al achieved IQE as high as 39% at 279 nm in a-plane AlGaN-based multiple quantum wells (MQWs) [14]. With the rapid development of crystal growth and the improvement of semiconductor manufacturing processes, micropyramid GaN-based UV LEDs on Si (111) can improve the EQE by SAG, which is ascribed to (1) high GaN crystal quality of lateral-growth [15], (2) semipolar plane of pyramid structure [12], and (3) larger emitting area of six planes of the pyramid.…”
Section: Introductionmentioning
confidence: 99%