2018
DOI: 10.1002/tee.22600
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High impedance fault detection and identification based on pattern recognition of phase displacement computation

Abstract: This paper proposes a new algorithm for high-impedance-fault (HIF) detection based on phase displacement computation (PDC). The PDC is calculated between the measured and reference three-phase voltage signals. There are two stages in this algorithm. In the first stage, the pattern of the PDC is analyzed to detect the occurrence of an event. In the second stage, the peak of the PDC is used as a feature to distinguish between HIF and non-HIF events. Subsequently, an automatic HIF classification algorithm based o… Show more

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Cited by 7 publications
(2 citation statements)
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“…A recurring concern over the years has been that most of the proposed techniques and methodologies are capable to detect HIFs, but they often confuse fault with normal system events, generating false positives, usually in situations such as switching capacitor banks and energizing transformers [6], [13], [14]. Therefore, it is possible to state that an adequate and permanent solution for HIF detection is still lacking, although many attempts have been made by the scientific community.…”
Section: Introductionmentioning
confidence: 99%
“…A recurring concern over the years has been that most of the proposed techniques and methodologies are capable to detect HIFs, but they often confuse fault with normal system events, generating false positives, usually in situations such as switching capacitor banks and energizing transformers [6], [13], [14]. Therefore, it is possible to state that an adequate and permanent solution for HIF detection is still lacking, although many attempts have been made by the scientific community.…”
Section: Introductionmentioning
confidence: 99%
“…However, neural network cannot learn during their online operation and wavelet require a deep knowledge of high-low filters and mother wavelet. Pattern recognition has combined with the wavelet transform and then used for detecting the HIF in [24], usually WT used for extracting the fault feature and pattern recognition used for classing the fault [25]. As well as, in [26] Stack-well transform (ST) is used for extracting the fault feature and then pattern recognition for assessing HIF.…”
Section: Introductionmentioning
confidence: 99%