HIGH FREQUENCY PARAMETER TECHNIQUES. Final Report.

Abstract

This report discusses the theory, .the Gonv~rsion factors,. and operatil+g procedures involved in measuring th~ scattering parameters for high frequency repr~sentation of transistors. 'fhe H~wlett-Packard test system is discussed as a potential s-parameter measur~ment tool.

Influence of Surface Defects on the Glare Characteristics of a Night Vision System with Refractive Optics

“…Hence, some glare spread functions were measured by the method mentioned in § 4 (described in more detail elsewhere [3,8]) and the opportunity was taken to compare the characteristics of several lenses, including some not designed for a night vision system . Figure 6 shows a set of glare spread functions for five lenses obtained by scanning the elementary source and using an on-axis detector.…”