By using an energy transport model, we simulate cutoff frequency fT versus collector
current density IC characteristics of npn−n AlGaAs/GaAs heterojunction bipolar
transistors (HBTs) with various n−-collector thickness and n−-doping densities. It is
found that the calculated fT characteristics show double peak behavior when the n−-
layer is thick enough and the n−-doping is high enough to allow existence of neutral n−-
region. The mechanism of the double peak behavior is discussed by studying energy
band diagrams, electron-energy profiles and electron-velocity profiles. Particularly, we
discuss the origin of the second peak (at higher IC) which is not usually reported
experimentally.