Abstract. The magnetoimpedance (MI) in thin films and magnetic multilayers has been extensively studied in recent years. One of the important problems which is still under discussion is the temperature dependence of MI of the multilayered nanostructures for temperatures up to
IntroductionThe magnetoimpedance effect (MI) is a change of the complex impedance of a soft ferromagnetic conductor under application of an external magnetic field [1][2][3][4]. The sensitivity of MI to a magnetic field was observed to be of the order of 500 %/Oe in amorphous ribbons [5]. However, in thin films the highest observed sensitivity did not exceed 35%/Oe [6]. The studies of the temperature dependence of the MI effect in flat multilayered structures are rather limited [7]. Therefore, the purposeful research of the planar MI structures is necessary for better understanding of the physical processes proceeding in the soft magnetic materials with a high MI sensitivity in the conditions close to the temperature range of technological applications.In this work, the magnetic properties and longitudinal MI were studied for the Fe 19 Ni 81 /Cu/Fe 19 Ni 81 multilayered elements with different geometries for a temperature range and frequency interval corresponding to the working areas for majority of the MI-based detectors.