High-Entropy Film Alloys: Electrophysical and Magnetoresistive Properties

The use of photovoltaic solar energy converters with nanowire solar cells is a promising direction for further development of photovoltaics. Along with this, significant interest in the properties of Si, InP, GaAs, InGaN nanowires as elements of high-efficiency photoconverters has formed a new direction of nanowire photovoltaics. The most relevant is the study of structural, optical, electrical, temperature and other characteristics of semiconductor nanowires. The paper presents the results of numerical simulation of coaxial p-in structures of solar cells based on Si and InP nanowires. The geometry of the 3D structures, light and dark current-voltage characteristics are designed using Silvaco TCAD tools. Within the framework of the drift-diffusion transport model with Fermi-Dirac statistics, the admissible values of the electrical parameters such as the open-circuit voltage UOC, short-circuit current density JSC, maximum power Pm, fill-factor FF, photovoltaic efficiency  and others are obtained. The temperature dependence of the current-voltage characteristics and electrical parameters is investigated. The temperature coefficients of the open-circuit voltage, short-circuit current density, fill-factor and efficiency for coaxial nanowire solar cells based on Si and InP are determined in the temperature range from 300 to 400 K. It is concluded that the thermal stability of the electrical parameters for InP-based photovoltaic converter is high, which is characteristic of direct band gap semiconductors. The obtained results of numerical simulation are in good agreement with the experimental data and can be used to predict the properties of nanowire solar cells.

Section: Simulation and Resultssupporting

confidence: 80%

Section: -3 a Bsupporting

confidence: 82%

Section: Introductionmentioning

confidence: 99%

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Simulation of Parameters of Coaxial Solar Cells Based on Si and InP Nanowires

Buryk¹,

Odnodvorets²,

Khyzhnya³

2021

“…Along with studies of films of pure magnetic metals (Ni, Co, Fe) and Cu, it is promising to study films of metal alloys [1][2][3][4][5] and film multilayer structures [6][7][8] which include these metals. Alloy films (as well as bulk alloys) have a number of advantages over pure metal films: by changing the composition of the alloy, materials with other electrophysical, physicochemical, and operational properties can be obtained.…”

Section: Introductionmentioning

confidence: 99%

X-Ray Spectral Microanalysis of Copper-Nickel Thin Films Alloys

Loboda,

Zubko,

Khursenko

et al. 2023

The article presents the results of studying the elemental composition of films of CuNi alloys by X-ray microanalysis (an X-ray microanalyzer based on an energy-dispersive spectrometer, which is part of the REM-103-01 scanning electron microscope). Alloy films 30-150 nm thick were obtained by simultaneous separate evaporation of the components (copper and nickel) in a vacuum of 10 -4 Pa. Copper was evaporated from a tungsten foil ribbon 0.05 mm thick. Nickel was evaporated by the electron beam method using an electron diode gun. The condensation rate was 0.5-1.5 nm/s. The purity of the evaporated metals was no less than 99.98 %. The calculated composition of the concentrations of the sample components varied over a wide range. The characteristic X-ray spectrum of the film substance was excited by scanning a section of the film with dimensions of 300  300 μm with an electron beam; for thicker films, the size of the scanning area was 1  1 μm. Thin Ni films of the same thickness were used as standards for quantitative measurements of the elemental composition of alloy films of a certain thickness. The results of X-ray microanalysis indicate a high purity of the films. Comparison of the calculated concentrations of alloys and the results of measurements by X-ray microanalysis showed that in the region of film thicknesses d  100 nm, the discrepancy is about 10 %, decreasing to 1 -3 % for sample thicknesses d  100 nm.

“…At the present stage of the development of materials science, the results of studies of the physical properties of magnetically inhomogeneous film materials are of great interest. Layered structures [1][2][3], or high-entropy alloys [4] in which spin-dependent electron scattering (SDES) can be realized deserve special attention. This is due to both the study of the features of SDES and the possibility of creating functional elements with improved operational characteristics [5][6][7][8].…”

Section: Introductionmentioning

confidence: 99%

Structure and Magnetoresistive Properties of Three-layer Films Сo(1 – x)Crx/Cu/Co

Bezdidko¹,

Nepijko²,

Shkurdoda³

et al. 2021

The paper presents experimental results concerning the structural-phase state, diffusion processes and magnetoresistive properties of three-layer films Сo(1 -x)Crx/Cu/Co/substrate (S) with Cr concentration in the upper layer up to 30 at. %. It is shown that the phase composition of both as-deposited and thermostabilized at the temperature of 700 K film samples with the layer thickness of 1÷30 nm corresponds to α(Co), f.c.c.(Cu) and α(Сo1 -xCrx). Studies of diffusion processes have shown that in the systems Сo(1 -x )Crx/Cu/Co/S the individuality of the layers is largely preserved both in the as-deposited state and after annealing at Tа  700 K with the penetration of Cr atoms through the Cu layer. It was found that for as-deposited and annealed at temperatures of 400 and 550 K films Сo(1 -x)Crx/Cu/Co/S with cCr  30 at. % in the upper layer, dF  20÷30 nm and dN  3÷15 nm there is an atypical character of the behavior of the field dependences of the magnetoresistance is due to the different values of the spin asymmetry coefficients of the ferromagnetic layers α