2004
DOI: 10.1016/j.elspec.2004.02.032
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High-energy resolution photoemission microspectroscopy: (1 1 1) domains featured by the Shockley and the image-potential states at a polycrystalline Cu surface

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Cited by 6 publications
(4 citation statements)
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“…The laser power was kept to be 0.13 nJ/pulse in order to avoid destruction of the SAMs and the influence of the space charge effect. 32 Note that all the 2PPE experiments were done with a single color, and thus, pump and probe pulses were not distinguished in this study. Photoelectrons emitted normal to the surface via two-photon processes were detected with a hemispherical electron energy analyzer (Thermo VG Scientific Alpha 110).…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The laser power was kept to be 0.13 nJ/pulse in order to avoid destruction of the SAMs and the influence of the space charge effect. 32 Note that all the 2PPE experiments were done with a single color, and thus, pump and probe pulses were not distinguished in this study. Photoelectrons emitted normal to the surface via two-photon processes were detected with a hemispherical electron energy analyzer (Thermo VG Scientific Alpha 110).…”
Section: Methodsmentioning
confidence: 99%
“…The light was focused onto the sample in the UHV chamber at an incident angle of 55° to the sample surface using an f = 400 mm concave mirror; the diameter of the spot size on the sample was up to 0.1 mm. The laser power was kept to be 0.13 nJ/pulse in order to avoid destruction of the SAMs and the influence of the space charge effect . Note that all the 2PPE experiments were done with a single color, and thus, pump and probe pulses were not distinguished in this study.…”
Section: Methodsmentioning
confidence: 99%
“…Photoelectrons emitted to the surface normal were detected with a hemispherical energy analyzer (VG 100AX) of 20 meV-energy resolution. The energy resolution including the analyzer and the spectral width of the VUV light was about 30 meV [7]. The sample was scanned with 0.1 lm-resolution.…”
Section: Methodsmentioning
confidence: 99%
“…By focusing coherent VUV radiation at a wavelength of 140 nm (8.86 eV photon energy), our micro-spot ultraviolet photoemission spectroscopy (micro-UPS) achieved 0.3 lm-lateral resolution and 30 meV-energy resolution [4][5][6][7]. We apply micro-UPS to a thin film of copper phthalocyanine (CuPc) deposited on a polycrystalline copper substrate, demonstrating the high lateral/energy resolutions can successfully reveal inhomogeneous electronic structures [8].…”
Section: Introductionmentioning
confidence: 94%