Proceedings of the 14th IEEE/ACM International Symposium on Nanoscale Architectures 2018
DOI: 10.1145/3232195.3232217
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High-Endurance Bipolar ReRAM-Based Non-Volatile Flip-Flops with Run-Time Tunable Resistive States

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Cited by 12 publications
(8 citation statements)
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“…A set operation is defined as switching between HRS and LRS, and reset is vice versa (Biglari et al, 2018). Because there is a large resistance variation, cell programming with verification could add an extra level of reliability (Higuchi et al, 2012).…”
Section: Write Methodologies In Rerammentioning
confidence: 99%
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“…A set operation is defined as switching between HRS and LRS, and reset is vice versa (Biglari et al, 2018). Because there is a large resistance variation, cell programming with verification could add an extra level of reliability (Higuchi et al, 2012).…”
Section: Write Methodologies In Rerammentioning
confidence: 99%
“…To tackle this problem, novel structures have been proposed that intrinsically reduce this stress at the cell level (Linn et al, 2010;Biglari and Fey, 2017). Write-verification (Song et al, 2013;Higuchi et al, 2012) and feedback-based programming (Lee et al, 2017;Biglari et al, 2018) terminate the write operation after detecting that the device has reached the desired state.…”
Section: Trade-offs In Writing Parameter Selectionsmentioning
confidence: 99%
“…The cell endurance (the maximum number of transitions between the high and low resistive states) may be considered the main limitation of NVFFs. This limited endurance can reduce the lifetime of NVPs and is receiving special attention in the community [120].…”
Section: Memory Applicationsmentioning
confidence: 99%
“…Resistive RAMs (ReRAMs) [57][58][59][60][61][62][63], which store the information as the variation of resistivity of a thin oxide film. A current is injected in the oxide to change its structure and to modify its resistance value.…”
Section: Non-volatile Memoriesmentioning
confidence: 99%