2016
DOI: 10.1039/c6ra06990h
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High dielectric constant and capacitance in ultrasmall (2.5 nm) SrHfO3 perovskite nanoparticles produced in a low temperature non-aqueous sol–gel route

Abstract: Strontium hafnium oxide (SrHfO3) has great potential as a high-k gate dielectric material, for use in memories, capacitors, CMOS and MOSFETs.

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Cited by 22 publications
(22 citation statements)
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“…35 This method is useful to investigate the crystalline nature of ultrasmall NPs. 36,37 Successful indexation of the FFT pattern was obtained, with the CoPt 3 Pm-3m structural data in good agreement with XRD analysis. The elemental quantification of the NPs was obtained from EDS analysis (Figure 2b).…”
supporting
confidence: 68%
See 1 more Smart Citation
“…35 This method is useful to investigate the crystalline nature of ultrasmall NPs. 36,37 Successful indexation of the FFT pattern was obtained, with the CoPt 3 Pm-3m structural data in good agreement with XRD analysis. The elemental quantification of the NPs was obtained from EDS analysis (Figure 2b).…”
supporting
confidence: 68%
“…The analysis of the fast Fourier transform (FFT) pattern (Figure c), obtained from one single NP (top inset of Figure b), and the comparison with the simulation, obtained using JEMS software, gives the structure of these NPs . This method is useful to investigate the crystalline nature of ultrasmall NPs. , Successful indexation of the FFT pattern was obtained, with the CoPt 3 Pm -3 m structural data in good agreement with XRD analysis. The elemental quantification of the NPs was obtained from EDS analysis (Figure b). …”
supporting
confidence: 52%
“…Nonaqueous sol–gel processing is a flexible and powerful approach to obtain functionally active NPs. 1418 Here, we present a facile, one-pot, nonhydrolytic synthesis of SnO 2 NPs with controllable average size and with a narrow size distribution at low temperature.…”
Section: Introductionmentioning
confidence: 99%
“…The microstructural features were analyzed via the whole powder pattern modeling (WPPM) method, through the PM2K software; this novel technique exploits XRD by describing each observed peak profile as a convolution of instrumental and sample‐related physical effects, and by refining the corresponding model parameters directly on the observed data . Therefore, adopting the WPPM formalism, microstructure information such as crystalline domain shape and size (ie, the size of coherently scattering domains), size distribution, defect type, and content, can be obtained quantitatively . The shape of the crystalline domains was approximated to be spherical, with diameter distributed according to a log‐normal curve.…”
Section: Methodsmentioning
confidence: 99%