2020 Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition (DATE) 2020
DOI: 10.23919/date48585.2020.9116202
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High Density STT-MRAM compiler design, validation and characterization methodology in 28nm FDSOI technology

Piyush Jain1,
Akshay Kumar2,
Nicolaas Van Winkelhoff3
et al.
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