Nanowires - Fundamental Research 2011
DOI: 10.5772/17956
|View full text |Cite
|
Sign up to set email alerts
|

High-Bias Instability of Atomic and Molecular Junctions

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2018
2018
2018
2018

Publication Types

Select...
1

Relationship

1
0

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 26 publications
(24 reference statements)
0
1
0
Order By: Relevance
“…Finally, I note that time-varying biases play an important role not only in signal transmission but also in contact stability. Single-atom metal contacts become destabilized at high biases and exhibit a current-induced breakdown [ 61 ]. One of probable failure mechanisms is electromigration (EM).…”
Section: Experiments On the Admittance Of Atom-sized Contacts Of Mmentioning
confidence: 99%
“…Finally, I note that time-varying biases play an important role not only in signal transmission but also in contact stability. Single-atom metal contacts become destabilized at high biases and exhibit a current-induced breakdown [ 61 ]. One of probable failure mechanisms is electromigration (EM).…”
Section: Experiments On the Admittance Of Atom-sized Contacts Of Mmentioning
confidence: 99%