2017
DOI: 10.3390/mi8080243
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High Aspect Ratio Nanoimprint Mold-Cavity Filling and Stress Simulation Based on Finite-Element Analysis

Abstract: High aspect ratio three-dimensional micro- and nanopatterns have important applications in diverse fields. However, fabricating these structures by a nanoimprinting method invites problems like collapse, dislocation, and defects. Finite-element analysis (FEA) is a good approach to help understand the filling process and stress distribution. The FEA method was employed to simulate the nanoimprinting process using positive and negative molds with aspect ratios of 1:1, 3:1, 5:1, and 7:1. During the filling proces… Show more

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Cited by 6 publications
(4 citation statements)
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“…4e . This deformation mode is similar to that of an imprinted polymer during the thermal nanoimprinting process reported in previous studies 47 – 49 . The straining capability of NISE is further investigated by simulating the imprinted MoS 2 with various imprint depths.…”
Section: Resultssupporting
confidence: 87%
“…4e . This deformation mode is similar to that of an imprinted polymer during the thermal nanoimprinting process reported in previous studies 47 – 49 . The straining capability of NISE is further investigated by simulating the imprinted MoS 2 with various imprint depths.…”
Section: Resultssupporting
confidence: 87%
“…The SiO 2 mold (25 × 25 mm 2 ) had a periodic line array patterned with pitch of 200 nm, line width of 100 nm, and depth of 200 nm. Although it is more conducive to improving the mechanical stability of patterned devices with a small period and large aspect ratio, the imprinting and demolding process with a high aspect ratio and small period is a major issue in nanoimprinting technology [25,26,27]. The period of 200 nm and aspect ratio of 2:1 are relatively mature parameters in nanoimprint technology, being more conducive to the successful preparation of patterns.…”
Section: Methodsmentioning
confidence: 99%
“…Moreover, understanding the dislocation and spring-back effects can present significant challenges solely with experimental analysis [7,8,18]. The finite element method (FEM) has been applied to study the cavity-filling process and induced stresses in the nanoimprint lithography process for a polymer [19]. Yasuda and his team employed FEM to investigate the material deformation during the NIL process for metal [20].…”
Section: Introductionmentioning
confidence: 99%