2014
DOI: 10.1016/j.aca.2014.07.040
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High angular-resolution automated visible-wavelength scanning angle Raman microscopy

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Cited by 5 publications
(5 citation statements)
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“…Similar trends are observed for sample 3‐Bi (Figure S2A) and sample 3‐Tri (Figure S3A). These representative calculated results suggest that it should be feasible to use SA Raman spectroscopy, with a signal that is proportional to the electric field intensity, to measure total film thickness as well as the location of polymer interfaces for both bilayer and trilayer films.…”
Section: Resultsmentioning
confidence: 90%
See 1 more Smart Citation
“…Similar trends are observed for sample 3‐Bi (Figure S2A) and sample 3‐Tri (Figure S3A). These representative calculated results suggest that it should be feasible to use SA Raman spectroscopy, with a signal that is proportional to the electric field intensity, to measure total film thickness as well as the location of polymer interfaces for both bilayer and trilayer films.…”
Section: Resultsmentioning
confidence: 90%
“…This way, the prism does not apply any pressure to the film or alter the film. A home‐built instrument, previously reported by Lesoine et al, was used to collect SA Raman spectra . A 532‐nm excitation source (Coherent, Santa Clara, CA) set to s‐polarized light was directed onto a sapphire prism by coupling the source into a polarization maintaining single mode fiber (Thorlabs, Newton, NJ).…”
Section: Methodsmentioning
confidence: 99%
“…Furthermore, the multidimensionality of the data (cone diameter and intensity and Raman scattering as a function of incident angle) provides the ability to measure more sample properties compared to either SPR or Raman scattering techniques alone. This is highlighted by our related previous work using a technique called scanning angle Raman spectroscopy, [37][38][39][40][41][42][43][44][45] whereby the incident light is scanned over a wide range of angles while simultaneously collecting the reflected light from the prism side and Raman scattering on the sample side of the interface. Scanning angle Raman spectroscopy (in the absence of a gold film) was used to identify buried interfaces in a multi-layered system with ~10s of nanometer spatial resolution.…”
Section: Figmentioning
confidence: 99%
“…Monolayer sensitivity has been achieved using various TIR Raman formats (Figure 9). [186][187][188][189] While the TIR enhancement is typically less than the SERS enhancement, the TIR Raman signal is very reproducible, well modeled and does not require a roughened metal substrate. Also, the TIR Raman signal is collected over a longer distance than is possible with SERS, so the entire membrane and associated cytoskeleton can be probed.…”
Section: Total Internal Reflection (Tir) Raman Spectroscopymentioning
confidence: 99%