2011
DOI: 10.5560/znb.2011.66b0155
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HF-HNO3-H2SO4/H2O Mixtures for Etching Multicrystalline Silicon Surfaces: Formation of NO2+, Reaction Rates and Surface Morphologies

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Cited by 12 publications
(4 citation statements)
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“…This fact, can be explained by the reduction of HF dissociation with increasing H 2 SO 4 concentration and formation of fluorosulfuric acid (Eq. (1)), which leads to a reduction of reactive fluoride ions (F − , HF 2− ) and a consequent decrease of the tantalum oxide dissolution rate [20,21]. Moreover, higher sulfuric acid concentrations also increase the solution viscosity and hinders the diffusion of fluoride-containing species (HF, F − and HF 2− ) to the surface, further limiting the oxide dissolution rate [21].…”
Section: Resultsmentioning
confidence: 99%
“…This fact, can be explained by the reduction of HF dissociation with increasing H 2 SO 4 concentration and formation of fluorosulfuric acid (Eq. (1)), which leads to a reduction of reactive fluoride ions (F − , HF 2− ) and a consequent decrease of the tantalum oxide dissolution rate [20,21]. Moreover, higher sulfuric acid concentrations also increase the solution viscosity and hinders the diffusion of fluoride-containing species (HF, F − and HF 2− ) to the surface, further limiting the oxide dissolution rate [21].…”
Section: Resultsmentioning
confidence: 99%
“…In silicon technology, wet silicon etching in chemical solutions based on a blend of hydrofluoric acid (HF), nitric acid (HNO 3 ), and water or other acids is frequently used. Wafer thinning and surface cleaning, [8][9][10] chemical-mechanical polishing (CMP) of the Si surface, [11][12][13][14][15][16][17] and elimination of saw damage [18][19][20] are all obtained by wet-chemical etching processing. The production of water-soluble complexes (SiF 6 , HSiF 6 , and others) and/or fluorosilanes (SiF 4 , HSiF 3 , and others) by hydrofluoric acid are both necessary for the acidic etching of silicon.…”
Section: Introductionmentioning
confidence: 99%
“…Surface texturing can improve internal light absorption over flat‐surfaced cells and substantially minimize reflection on a cell's surface. [ 6,7 ] The Si surface cleaning, [ 8–10 ] chemical–mechanical polishing (CMP) of the Si surface, [ 11–17 ] and elimination of saw damage [ 18–20 ] are all obtained by wet‐chemical etching processing. The production of water‐soluble complexes (SiF 6 , HSiF 6 , and others) and/or fluorosilanes (SiF 4 , HSiF 3 , and others) by hydrofluoric acid are both necessary for the acidic etching of silicon.…”
Section: Introductionmentioning
confidence: 99%
“…[35] In the overall context, industrial processes such as the chemical etching of silicon wafers by concentrated nitric acid are especially interesting since gas mixtures with an NO content of up to 20 % are produced. [36,37] Owing to the very unsteady evolution of NO, denitrification is particularly difficult by known selective catalytic reduction (SCR) [38] or selective non-catalytic reduction (SNCR) [39] methods. NO fixation and later conversion, as is done in the carbonitrosation protocol, might therefore be a valuable alternative.…”
mentioning
confidence: 99%