2016
DOI: 10.18293/seke2016-090
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Heterogeneous Defect Prediction via Exploiting Correlation Subspace

Abstract: Abstract-Software defect prediction generally builds models from intra-project data. Lack of training data at the early stage of software testing limits the efficiency of prediction in practice. Thereby researchers proposed cross-project defect prediction using the data from other projects. Most previous efforts assumed the cross-project defect data have the same metrics set which means the metrics used and size of metrics set are same in the data of projects. However, in real scenarios, this assumption may no… Show more

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Cited by 23 publications
(23 citation statements)
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References 22 publications
(35 reference statements)
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“…To be fair, we choose LR classifier for all compared methods except for CCT‐SVM, which uses the default SVM classifier . Comparison of CLSUP and CCT‐SVM using the SVM classifier will be reported in Section 4.5.4.…”
Section: Methodsmentioning
confidence: 99%
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“…To be fair, we choose LR classifier for all compared methods except for CCT‐SVM, which uses the default SVM classifier . Comparison of CLSUP and CCT‐SVM using the SVM classifier will be reported in Section 4.5.4.…”
Section: Methodsmentioning
confidence: 99%
“…Recently, heterogeneous fault prediction (HFP) models are presented to predict faults across projects with heterogeneous metric sets, ie, source and target projects have different metric sets. For example, Jing et al presented a transfer CCA (canonical correlation analysis)+ method by using unified metric representation (UMR) and CCA‐based transfer learning technique for HFP.…”
Section: Introductionmentioning
confidence: 99%
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“…The second mainstream way is to design effective defect predictor based on transfer learning techniques (e.g., [7,10,15,16,17,18,19]). For instance, Ma et al [15] proposed Transfer Naï ve Bayes (TNB) model.…”
Section: A Defect Predictionmentioning
confidence: 99%
“…Another challenge in CCDP is that the set of metrics between the source company data and target company data is usually heterogeneous. Jing et al [7] and Chen et al [19] proposed the effective solutions for heterogeneous cross-company defect prediction.…”
Section: A Defect Predictionmentioning
confidence: 99%