“…Electron microscopy can image domain sizes, but suffers from poor signal-to-noise due to very little contrast between P3HT and PCBM (Andersson et al, 2009;Oosterhout et al, 2009;van Bavel et al, 2010;2008;Yang et al, 2005). Scanning probe techniques mostly give information about the top surface, though some charge transport information can be derived from specialized scanning probe techniques (Groves et al, 2010;Pingree et al, 2009;Reid et al, 2008). The vertical segregation of materials can be determined non-destructively using refraction techniques (including ellipsometry (Campoy-Quiles et al, 2008;Madsen et al, 2011), X-ray (Andersen, 2009;Germack et al, 2010), and neutron scattering (Lee et al, 2010;Mitchell et al, 2004)).…”