The tantalum-encapsulating Si16 cage nanocluster superatom
(Ta@Si16) has been a promising candidate for a building
block of nanocluster-based functional materials. Its chemical states
of Ta@Si16 deposited on an electron acceptable C60 fullerene film were evaluated by X-ray and ultraviolet photoelectron
spectroscopies (XPS and UPS, respectively). XPS results for Si, Ta,
and C showed that Ta@Si16 combines with a single C60 molecule to form the superatomic charge transfer (CT) complex,
(Ta@Si16)+C60
–.
The high thermal and chemical robustness of the superatomic CT complex
has been revealed by the XPS and UPS measurements conducted before
and after heat treatment and oxygen exposure. Even when heated to
720 K or subjected to ambient oxygen, Ta@Si16 retained
its original framework, forming oxides of Ta@Si16 superatom.