Height Fluctuations and Surface Gradients in Topographic Measurements

Lemesle, Julie; Moreau, Clément; Deltombe, Raphaël; Martin, Joseph B.; Blateyron, François; Bigerelle, Maxence; Brown, Christopher A.

doi:10.3390/ma16155408

Cited by 5 publications

(4 citation statements)

References 26 publications

(40 reference statements)

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“…This initial point leads to the second, which concerns measurement uncertainties in general. The fluctuations in heights can be estimated through multiple topographical measurements at the same location, as demonstrated by Lemesle et al [31,32]. The authors argue that the largest measurement fluctuations correspond to regions with significant plastic deformations, namely from grit blasting.…”

Section: Resultsmentioning

confidence: 94%

Two 3D Fractal-Based Approaches for Topographical Characterization: Richardson Patchwork versus Sdr

Berkmans,

Lemesle,

Guibert

et al. 2024

Materials

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Various methods exist for multiscale characterization of surface topographies, each offering unique insights and applications. The study focuses on fractal-based approaches, distinguishing themselves by leveraging fractals to analyze surface complexity. Specifically, the Richardson Patchwork method, used in the ASME B46.1 and ISO 25178 standards, is compared to the Sdr parameter derived from ISO 25178-2, with a low-pass Gaussian filter for multiscale characterization. The comparison is performed from the relative area calculated on topographies of TA6V samples grit blasted with different pressures and blasting materials (media). The surfaces obtained by grit blasting have fractal-like characteristics over the scales studied, enabling the analysis of area development at multiple levels based on pressure and media. The relative area is similar for both methods, regardless of the complexity of the topographies. The relevance scale for each calculation method that significantly represents the effect of grit blasting pressure on the increased value of the relative area is a tiling of 7657.64 µm² of triangle area for the Patchwork method and a 124.6 µm cut-off for the low-pass Gaussian filter of the Sdr method. These results could facilitate a standard, friendly, new fractal method for multiscale characterization of the relative area.

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Section: Resultsmentioning

confidence: 94%

Two 3D Fractal-Based Approaches for Topographical Characterization: Richardson Patchwork versus Sdr

Berkmans,

Lemesle,

Guibert

et al. 2024

Materials

Self Cite

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“…These locations are separated by sampling intervals. Missing height measurements occur primarily at locations in regions where large inclinations are present [43,44].…”

Section: Previous Resultsmentioning

confidence: 99%

Correlational study of multiscale analysis and the metrological characteristics of areal surface topography measuring instruments

Eifler,

Hering-Stratemeier,

von Freymann

et al. 2024

Surf. Topogr.: Metrol. Prop.

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With the metrological characteristics, an effective framework for the calibration, adjustment, performance specification and verification of areal surface topography measuring instruments has been introduced. The characteristics have been thoroughly researched and analyzed for their different applications. Each characteristic provides specific information for a certain axis or feature of the measuring instrument. This enables an uncertainty estimation and a comparability of different measuring instruments. In this study, the comparison results of metrological characteristics are correlated with information obtained from multiscale analysis. With this examination it can be shown that both, metrological characteristics and multiscale analysis include significant information about transfer behaviors of surface structures, which can be applied advantageously for a calibration, performance verification and uncertainty determination of areal surface topography measuring instruments.

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“…Other means of comparisons can be used: Mettänen and Hirn [15] computed a correlation graph (R 2 ), Peta et al [16] also suggest a new approach based on correlation graph for comparing height maps from the three modes of Sensofar ® S neox TM (FV, CM and CSI). Lemesle et al [17], Lemesle et al [18], or Vanrusselt and Haitjema [19] based their conclusions on deviation examinations.…”

Section: State-of-the-art 1instrument Comparisonsmentioning

confidence: 99%

A novel methodology to assess optical profilometer stability to discriminate surface roughness

Moreau,

Bigerelle,

Marteau

et al. 2024

Surf. Topogr.: Metrol. Prop.

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A new method is proposed to investigate the measurement variation of instruments and their ability to discriminate two TA6V surfaces obtained by grinding with SiC grit papers (80 and 120). Three optical measurement technologies included into a single apparatus, namely Confocal Microscopy (CM), Focus Variation (FV) and Coherence Scanning Interferometry (CSI), were used to measure both ground surfaces according to a specific experimental protocol (MorphoMeca Monitoring) based on measurement iterations and repetitions. From the measurements, four indices were built from the Sa roughness parameter to assess the Quality (ratio of the topographical variability over the measurement noise), the Drift (related to surface fluctuations) and the Stability (estimation of the temporal drift using a second order autoregressive model) of the three measurement technologies (modes), as well as theirRelevance (computed from an analysis of variance) to discriminate ground surfaces with close roughness. For these investigated surfaces, it was especially highlighted that the Quality Index is four times higher for the CSI mode than for the FV and CM modes. All the used measurement modes experienced small drifting (Drift Index) during the measurements. The CSI mode was slightly more sensitive to drift than the FV and CM modes. The Stability Index indicated that there was no memory effect between two acquisitions for each measurement mode, i.e., the temporal drift did not depend on the measurement mode. Moreover, the three measurementmodes are able to discriminate the two ground surfaces with the same accuracy through the Sa parameter. However, the Sa values may vary depending on the measurement modes, and it was finally shown that the Sa parameter is minimized by 0.03 µm for the FV mode compared with the CSI mode, due to its smoothing effect.

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Height Fluctuations and Surface Gradients in Topographic Measurements

Cited by 5 publications

References 26 publications

Two 3D Fractal-Based Approaches for Topographical Characterization: Richardson Patchwork versus Sdr

Two 3D Fractal-Based Approaches for Topographical Characterization: Richardson Patchwork versus Sdr

Correlational study of multiscale analysis and the metrological characteristics of areal surface topography measuring instruments

A novel methodology to assess optical profilometer stability to discriminate surface roughness

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