1979
DOI: 10.1016/0029-554x(79)90400-2
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Heavy ion track lengths in solid dielectric track detectors

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Cited by 79 publications
(18 citation statements)
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“…The mean range of lI9Xe at different energies has been obtained from this value using the energy-loss curve. Figure 4 shows a plot of the experimental mean range of '29Xe in mica against ion energy along with the values obtained from four different computer codes RANGE [18], TRIM [19], HB [20] and HUBERT [21]. Theexperimental values obtained were compared with these theoretical values and were found to be quite comparable within the error limits.…”
Section: Resultsmentioning
confidence: 86%
“…The mean range of lI9Xe at different energies has been obtained from this value using the energy-loss curve. Figure 4 shows a plot of the experimental mean range of '29Xe in mica against ion energy along with the values obtained from four different computer codes RANGE [18], TRIM [19], HB [20] and HUBERT [21]. Theexperimental values obtained were compared with these theoretical values and were found to be quite comparable within the error limits.…”
Section: Resultsmentioning
confidence: 86%
“…This system allows us to analyze the object structures with high spatial resolution. After measuring the projected track length, the total etchable range was determined by applying the corrections due to the angle of incidence, bulk etching and over-etching [12]. Knowing the total etchable range, it is possible to determine the residual range of different heavy ions.…”
Section: Etching Processmentioning
confidence: 99%
“…The true track lengths (Ä) were then calculated from measured projected track lengths using the formulations [12] as follows: Ä Ð Ó׳µ · Î Ø × Ò³µ Î ´Ø Ø µ (2) where, Ð is the projected track length as observed by the microscope, ³ is the angle of irradiation,´Î Ø × Ò³µ is the surface etching correction, Ø is the etching time, Ø is the complete etching time that corresponds to a fixed value of track diameter which is independent of temperature of a given etchant and dielectric [13]. Î ´Ø Ø µ is the overetching correction.…”
Section: Theoretical Aspectsmentioning
confidence: 99%