Heavy ion-induced MCUs in 28 nm SRAM-based FPGAs: upset proportions, classifications, and pattern shapes

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Heavy ion-induced MCUs in 28 nm SRAM-based FPGAs: upset proportions, classifications, and pattern shapes

Cited by 4 publications

References 27 publications

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The role of nuclear fragmentations in high energy transfers to a micro-object exposed to primary space radiation

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