Heavy-ion induced analog SET impact on inter-stage inductor low noise amplifiers at 10 and 30 GHz frequencies

Abstract

This research article investigated the analog single transient (Analog SET) impact on inter-stage inductor low-noise amplifiers (LNA) working in the 10 and 30 GHz frequencies. The impact of a single event is analysed in two different cases; (a) the absence of radio-frequency signal input (i.e., DC voltage alone), and (b) the presence of radio-frequency with the DC voltage. Case (a) is analysed in the time-domain, where as the collected charge (QCol) is estimated by the integration of transient current with time appropriate limits, and Case (b) evaluates the LNA output disturbance by spectrogram(mathematical tool) outcome due to radiation hits on the MOSFET (Metal-Oxide Semiconductor Field Effect Transistor), which is used for formulate the LNA circuit. The article conclusion arrives from estimated collected charge (QCol) on the ion track of the device which is used to formulate the LNA, and their spectrogram results of the disturbed LNA output on the radiation environment. Based on these LNA metrics, the radiation strike disturb the LNA more when working on a low-frequency signal (10 GHz) than the LNA working on a high-frequency signal (30 GHz).