Heavy Ion and TID Characterization of 3.3 V Voltage Supervisors

Wilson, Anthony L.; Walz, Dale; Lotfi, Younes; Merkel, Kenneth G.; Thun, Matt Von; Farris, T.

doi:10.1109/nsrec.2017.8115463

2017 IEEE Radiation Effects Data Workshop (REDW) 2017

DOI: 10.1109/nsrec.2017.8115463

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Heavy Ion and TID Characterization of 3.3 V Voltage Supervisors

Anthony L. Wilson¹,

Dale Walz²,

Younes Lotfi³

et al.

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Heavy Ion and TID Characterization of 3.3 V Voltage Supervisors

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