HBT devices and circuits for signal and data processing

Yu, R.; Beccue, S.; Chang, M.F.; Nary, K.R.; Nubling, R.B.; Pedrotti, Kenneth D.; Pierson, R.; Runge, K.; Sheng, N.H.; Thomas, Philipp; Zampardi, P.J.; Wang, K. C.

doi:10.1016/s0038-1101(97)00085-3

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HBT devices and circuits for signal and data processing

Cited by 8 publications

References 5 publications

System Interconnects

System Interconnects

Device Damage During Low Temperature High-Density Plasma Chemical Vapor Deposition

Device degradation during low temperature ECR-CVD. Part II: GaAs/AlGaAs HBTs

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