1993
DOI: 10.1007/978-1-4615-2840-1_20
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Has the True Ion-Induced Electron Yield from Copper and Other Metals Been Measured?

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Cited by 1 publication
(3 citation statements)
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“…The annealing temperature and duration required for a significant change in γ i for heavily sputtered surfaces and Ar + energies of interest for discharges is unknown. A small decrease in γ i is observed [77] for 10 keV Ar + incident on sputtered Cu when the surface is annealed at 200-300 • C. The changes in γ i with intense sputtering are qualitatively consistent with the changes observed [39,104,105] in surface morphology.…”
Section: Swarm Results For Sputtered Metal Surfacessupporting
confidence: 82%
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“…The annealing temperature and duration required for a significant change in γ i for heavily sputtered surfaces and Ar + energies of interest for discharges is unknown. A small decrease in γ i is observed [77] for 10 keV Ar + incident on sputtered Cu when the surface is annealed at 200-300 • C. The changes in γ i with intense sputtering are qualitatively consistent with the changes observed [39,104,105] in surface morphology.…”
Section: Swarm Results For Sputtered Metal Surfacessupporting
confidence: 82%
“…Beam experiments in which the target is cleaned by ion sputtering have been reported [39,44,71,73,74,77]. Experiments using sputtering followed by yield measurements at ion energies below 4 keV are shown for Au targets [71] in figure 1.…”
Section: Beam Results For Clean Metalsmentioning
confidence: 99%
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