2020
DOI: 10.48550/arxiv.2002.04210
|View full text |Cite
Preprint
|
Sign up to set email alerts
|

Hardware Trust and Assurance through Reverse Engineering: A Survey and Outlook from Image Analysis and Machine Learning Perspectives

Ulbert J. Botero,
Ronald Wilson,
Hangwei Lu
et al.

Abstract: In the context of hardware trust and assurance, reverse engineering has been often considered as an illegal action. Generally speaking, reverse engineering aims to retrieve information from a product, i.e., integrated circuits (ICs) and printed circuit boards (PCBs) in hardware security-related scenarios, in the hope of understanding the functionality of the device and determining its constituent components. Hence, it can raise serious issues concerning Intellectual Property (IP) infringement, the (in)effectiv… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2023
2023
2023
2023

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 81 publications
(129 reference statements)
0
1
0
Order By: Relevance
“…Electronic Microprobe is classified as an invasive attack along with fault injection and reverse engineering, as they both require complete encapsulation removal and circuit wiring exposure. Today's most commonly used and powerful electron probe tool is the Focused Ion Beam (FIB) [60,61]. Through FIB technology, attackers can achieve sub-micron or even nano-level precision [62].…”
Section: Electron Microprobementioning
confidence: 99%
“…Electronic Microprobe is classified as an invasive attack along with fault injection and reverse engineering, as they both require complete encapsulation removal and circuit wiring exposure. Today's most commonly used and powerful electron probe tool is the Focused Ion Beam (FIB) [60,61]. Through FIB technology, attackers can achieve sub-micron or even nano-level precision [62].…”
Section: Electron Microprobementioning
confidence: 99%