Hard X-Ray Photoemission Spectroscopy

Electronic origin of hydrogen storage in MOF-covered palladium nanocubes investigated by synchrotron X-rays

“…However, photoelectron spectroscopy using UV light or soft X-rays provides only a surface-sensitive electronic structure because of the short probing depth. By contrast, with the use of hard X-rays photoelectron spectroscopy (HAXPES), the kinetic energy of photoelectrons can be enhanced, and the probing depth is much greater 18 . Additionally, near-edge X-ray absorption fine structure (NEXAFS) are equally applicable for determining the conduction bands 19 .…”

Valence fluctuation in Yb3Si5 probed by synchrotron X-ray photoemission spectroscopy

“…20) However, the intrinsic electronic structure was smeared out by the overlap with the 4 f 5/2 electron and the surface state of the 4f 7/2 electron because of insufficient energy resolution. The large contribution of the surface is possibly due to the short escape depth of the photoelectron with not a high enough kinetic energy 24) and the surface roughness of the scratched polycrystalline sample. Hence, a high energy resolution measurement with a high excitation energy, using single crystalline Yb 3 Si 5 is required, and we therefore performed soft and hard X-ray photoemission spectroscopy (SXPES and HAXPES) in SPring-8 which enable us to make bulk sensitive and high-resolution measurements.…”

Effective attenuation length from core-level photoelectron spectroscopy of CS2clusters

“…This is, however, a less favourable approach due to post-collision interaction of the photo-and Auger electrons [10]. Recent developments, see for example [11], have allowed experiments to be carried out with photoelectron kinetic energies in the range 1-10 keV. At these high energies, one achieves increased sampling depth without destroying the sample.…”