2020
DOI: 10.1063/1.5143548
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Hall voltage reversal and structural phase transition in VO2 thin films

Abstract: In this work, we investigated the nanoscale conduction and charge transport characteristics of epitaxial VO2 thin films around the metal-insulator transition (MIT) using the Hall transport measurement and conduction atomic force microscopy. Unlike the conventional oxides, the VO2 thin films show unique transport characteristics. First, the dominant carrier type shows a critical change from electron to hole during the MIT sequence (cooling sequence) or from hole to electron during the reverse MIT sequence (heat… Show more

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Cited by 1 publication
(2 citation statements)
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“…58 So for complex multi-structure PT systems or high-throughput operations, a constant relaxation time ( τ = 10) approximation 58 is usually used. Our theoretical conductivity and carrier concentration are strongly supported by previous experimental observations 26 as shown in Fig. S5, ESI† and Fig.…”
Section: Resultssupporting
confidence: 90%
See 1 more Smart Citation
“…58 So for complex multi-structure PT systems or high-throughput operations, a constant relaxation time ( τ = 10) approximation 58 is usually used. Our theoretical conductivity and carrier concentration are strongly supported by previous experimental observations 26 as shown in Fig. S5, ESI† and Fig.…”
Section: Resultssupporting
confidence: 90%
“…7,24 These metallic nanopuddles actually can be experimentally stabilized or captured by a surface coordination approach. 25 Their Hall measurement further revealed 26 that there exists alternation of the dominant carrier type from electrons to holes near 330 K and then from holes to electrons near 332 K. The existence of an intermediate phase allows us to divide the thermally induced PT from low to high temperature into two stages, i.e. the M 1 to an intermediate phase and the intermediate phase to the R phase.…”
Section: Introductionmentioning
confidence: 99%