Seventh International Symposium on Negative Ions, Beams and Sources (Nibs 2020) 2021
DOI: 10.1063/5.0057549
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H− ion source research and development at the Oak Ridge National Laboratory

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Cited by 10 publications
(16 citation statements)
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“…Over the years, many improvements have been made to both the SNS internal [3] and external [7] antenna ion sources and are too extensive to discuss here. Looking forward, we are trying to minimize minor physical differences between the production ion source and spare sources.…”
Section: The Sns Cs-enhanced Rf-driven Multicusp Hion Sourcementioning
confidence: 99%
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“…Over the years, many improvements have been made to both the SNS internal [3] and external [7] antenna ion sources and are too extensive to discuss here. Looking forward, we are trying to minimize minor physical differences between the production ion source and spare sources.…”
Section: The Sns Cs-enhanced Rf-driven Multicusp Hion Sourcementioning
confidence: 99%
“…We also plan to explore incremental improvements in beam intensity by testing slightly larger outlet apertures as well as improving electron management by implementing filter circuits and improved power supplies. Development of the external-antenna ion source also continues as a contingency source for the SNS should any issues with the internal antennas reemerge [7]. Development of this source now focuses on standardizing build quality of the source and improving the reliability of plasma ignition [4].…”
Section: The Sns Cs-enhanced Rf-driven Multicusp Hion Sourcementioning
confidence: 99%
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“…A DC, 800 V electron gun had limited lifetime of ~2 weeks due to cathode sputtering or surface degradation. An RF assisted DC gun allowed lower voltage to start with, but the voltage had to be increased over time still beyond the cathode sputter threshold [5]. Recently, a pulsed DC gun (60Hz, 500 Ps) was successfully tested with ~2 kV for ~90 days on a test bench.…”
Section: Continued Development Of External Antenna Rf Hion Sourcementioning
confidence: 99%
“…The beam output from the RFQ is continuously monitored with a beam current monitor toroid (BCM). Besides the Hinjector on the SNS accelerator system, we also operate two similar Hinjectors on test facilities for ion source and LEBT development, and for new RFQ commissioning and various beam studies [1][2][3][4][5].…”
Section: Introductionmentioning
confidence: 99%