2013
DOI: 10.1107/s0108767313098425
|View full text |Cite
|
Sign up to set email alerts
|

Guidelines for solving structures of polycrystalline materials using charge flipping

Abstract: In order to obtain structural information from X-ray powder diffraction data (XPD), both the phase and the overlap problem need to be solved. Structure determination methods developed for single-crystal diffraction data can be used, but their success depends on how (or if) the overlap problem is treated, and on the quality of the data. Direct-space methods, on the other hand, overcome both problems by using chemical knowledge. Although these methods also work on low resolution data, their success depends on th… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 5 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?