Abstract:In order to obtain structural information from X-ray powder diffraction data (XPD), both the phase and the overlap problem need to be solved. Structure determination methods developed for single-crystal diffraction data can be used, but their success depends on how (or if) the overlap problem is treated, and on the quality of the data. Direct-space methods, on the other hand, overcome both problems by using chemical knowledge. Although these methods also work on low resolution data, their success depends on th… Show more
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