Growth, Structure, and Anisotropic Optical Properties of Difluoro-anthradithiophene Thin Films

Storzer, Timo; Hinderhofer, Alexander; Zeiser, Clemens; Novák, Jiřı́; Fišer, Zbyněk; Belova, Valentina; Reisz, Berthold; Maiti, Swatilekha; Duva, Giuliano; Hallani, Rawad K.; Gerlach, Alexander; Anthony, John E.; Schreiber, Frank

doi:10.1021/acs.jpcc.7b06558

Cited by 13 publications

(18 citation statements)

References 64 publications

(77 reference statements)

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“…Whether organic thin films become rougher or smoother on heated substrates is dependent on many parameters, such as the deposition rate (Storzer et al, 2017;Farahzadi et al, 2010) and the chemical structure (Belova et al, 2018;Reisz et al, 2017). Furthermore, the roughness depends on the film thickness and the choice of substrate (Dü rr et al, 2003;Kowarik et al, 2006;Yim & Jones, 2006;Hong et al, 2008;Zhang et al, 2009Zhang et al, , 2011Kim et al, 2010;Hinderhofer et al, 2011;Obaidulla & Giri, 2015;Nahm & Engstrom, 2016;Brillante et al, 2017;Chiodini, Straub et al, 2020).…”

Section: Discussionmentioning

confidence: 99%

Polymorphism and structure formation in copper phthalocyanine thin films

et al. 2021

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Many polymorphic crystal structures of copper phthalocyanine (CuPc) have been reported over the past few decades, but despite its manifold applicability, the structure of the frequently mentioned α polymorph remained unclear. The base-centered unit cell (space group C2/c) suggested in 1966 was ruled out in 2003 and was replaced by a primitive triclinic unit cell (space group P 1). This study proves unequivocally that both α structures coexist in vacuum-deposited CuPc thin films on native silicon oxide by reciprocal space mapping using synchrotron radiation in grazing incidence. The unit-cell parameters and the space group were determined by kinematic scattering theory and provide possible molecular arrangements within the unit cell of the C2/c structure by excluded-volume considerations. In situ X-ray diffraction experiments and ex situ atomic force microscopy complement the experimental data further and provide insight into the formation of a smooth thin film by a temperature-driven downward diffusion of CuPc molecules during growth.

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Section: Discussionmentioning

confidence: 99%

Polymorphism and structure formation in copper phthalocyanine thin films

et al. 2021

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“…In fact, the anisotropic optical properties (DNBDT), 57 and its derivatives, have been observed by optical measurements. 2,[14][15][16][21][22][23][24][25][26] The method is probably applicable to organic materials by adequately choosing the wavelength of irradiation light. Because organic materials with HOMO-LUMO energy gaps with less than ~2.7 eV absorb visible light, the crystal orientation might be determined by an optical microscope with a normal irradiation lamp.…”

Section: Discussionmentioning

confidence: 99%

“…The confirmation of crystal orientation in bulk or thin-films was performed by X-ray diffraction, 3,[7][8][9][10][11][12][13][14][15][16] low-energy electron diffraction (LEED), [17][18][19] photoemission electron microscopy, 20 optical measurements, 2,[14][15][16][21][22][23][24][25][26][27][28][29][30][31][32][33][34][35][36][37][38] and atomic force microscopy (AFM). 2,30,[39][40][41][42][43] For small molecule organic materials that are soluble in organic solvents, X-ray diffraction measurement and absorption spectroscopy 2,15,16,21,22 have been used to investigat...…”

Section: Introductionmentioning

confidence: 99%

Crystal Orientation Imaging of Organic Monolayer Islands by Polarized Light Microscopy

Hattori

Kitamura

2020

ACS Appl. Mater. Interfaces

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The initial stage of organic semiconductor film formation greatly affects the properties of films, which are used in organic devices including thin-film transistors and lightemitting diodes. Organic monolayer islands that are formed on a suitable substrate can be observed with a conventional optical microscope. Furthermore, the use of a polarized microscope allows to determine the refractive index and crystal orientation of islands. Here, we report organic monolayer islands of 2,9-diphenyl-dinaphtho[2,3-b:2′,3′-f]thieno[3,2-b]thiophene (DPh-DNTT) deposited on a Si substrate with thermally grown SiO2 to investigate the crystal orientation of islands by polarized light microscopy. The observation of DPh-DNTT islands under polarized quasi-monochromatic light reveals that reflection intensity depends on both the crystal orientation and irradiation wavelength. A comparison between experimental and calculated reflection intensities provides an estimate of an anisotropic complex refractive index in the plane. The crossed-polarized microscopy image of a SiO2/Si substrate with DPh-DNTT islands shows that the contrast between the islands and SiO2 surface is sensitive to the angle between the polarizer and analyzer and depends on the direction of crystal orientation. The dependence of reflection contrast, which can be explained by the anisotropic extinction coefficient, is used to confirm crystal orientation.

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“…The same question was addressed by combining GID and XRR to study the growth kinetics of ultrathin films of a prototypical OSC DIP [225]. The identical character of the substrate temperature for growth of OPV and organic LED and FET from small-molecule OSC was demonstrated by growth, structure, and anisotropic optical properties of difluoroanthradithiophene thin films [226]. The prototypical n-type OSC PDIF-CN2 was assembled into well-ordered nanoarchitectures by LB technique and a multiscale analysis of the correlation between their structural and electrical properties was performed using XRR and GID [227].…”

Section: Polymer Photovoltaicsmentioning

confidence: 99%

Synchrotron Scattering Methods for Nanomaterials and Soft Matter Research

Narayanan

Konovalov

2020

Materials

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This article aims to provide an overview of broad range of applications of synchrotron scattering methods in the investigation of nanoscale materials. These scattering techniques allow the elucidation of the structure and dynamics of nanomaterials from sub-nm to micron size scales and down to sub-millisecond time ranges both in bulk and at interfaces. A major advantage of scattering methods is that they provide the ensemble averaged information under in situ and operando conditions. As a result, they are complementary to various imaging techniques which reveal more local information. Scattering methods are particularly suitable for probing buried structures that are difficult to image. Although, many qualitative features can be directly extracted from scattering data, derivation of detailed structural and dynamical information requires quantitative modeling. The fourth-generation synchrotron sources open new possibilities for investigating these complex systems by exploiting the enhanced brightness and coherence properties of X-rays.

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Growth, Structure, and Anisotropic Optical Properties of Difluoro-anthradithiophene Thin Films

Cited by 13 publications

References 64 publications

Polymorphism and structure formation in copper phthalocyanine thin films

Polymorphism and structure formation in copper phthalocyanine thin films

Crystal Orientation Imaging of Organic Monolayer Islands by Polarized Light Microscopy

Synchrotron Scattering Methods for Nanomaterials and Soft Matter Research

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