Two-dimensional
(2D) semiconductors, such as transition-metal dichalcogenides
(TMDs), have attracted immense interest due to their excellent electronic
and optical properties. The combination of single and multilayered
2D TMDs coupled with either Si or II–VI semiconductors can
result in robust and reliable photodetectors. In this paper, we report
the deposition process of MoSe2-layered films using pulsed
laser deposition (PLD) over areas of 20 cm2 with a tunable
band gap. Raman and X-ray diffraction indicates crystalline and highly
oriented layered MoSe2. X-ray photoelectron spectroscopy
shows Mo and Se present in the first few layers of the film. Rutherford
backscattering demonstrates the effect of O and C on the surface and
film/substrate interface of the deposited films. Ultraviolet–visible
spectroscopy, Kelvin probe, photoelectron spectroscopy, and electrical
measurements are used to investigate the band diagram and electrical
property dependence as a function of MoSe2 layers/thickness.
As the MoSe2 thickness increases from 3.5 to 11.4 nm, the
band gap decreases from 1.98 to 1.75 eV, the work function increases
from 4.52 to 4.72 eV, the ionization energy increases from 5.71 to
5.77 eV, the sheet resistance decreases from 541 to 56.0 kΩ,
the contact resistance decreases from 187 to 54.6 Ω·cm2, and the transfer length increases from 2.27 to 61.9 nm.
Transmission electron microscopy (TEM) cross-sectional images demonstrate
the layered structure of the MoSe2 with an average interlayer
spacing of 0.68 nm. The fabricated MoSe2–Si photodiodes
demonstrate a current on/off ratio of ∼2 × 104 orders of magnification and photocurrent generation with a 22.5
ns rise time and a 190.8 ns decay time, respectively.