2019
DOI: 10.1021/acsami.9b08830
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Growth of WOx from Tungsten(VI) Oxo-Fluoroalkoxide Complexes with Partially Fluorinated β-Diketonate/β-Ketoesterate Ligands: Comparison of Chemical Vapor Deposition to Aerosol-Assisted CVD

Abstract: Tungsten­(VI) oxo complexes of the type WO­(OR)3L [R = C­(CH3)2CF3, C­(CF3)2CH3, CH­(CF3)2, L = hexafluoroacetylacetonate (hfac), ethyl trifluoroacetoacetonate (etfac), acetylacetonate (acac)] bearing partially fluorinated alkoxide and/or chelating ligands were synthesized. Thermal decomposition behavior and mass spectrometry (MS) fragmentation patterns of selected examples were studied. The thermolysis products of WO­(OC­(CF3)2CH3)3(hfac) were characterized by nuclear magnetic resonance and gas chromatography… Show more

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Cited by 6 publications
(5 citation statements)
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“…The films deposited on a common glass display remarkable EC performance with maximum coloration efficiency of 66 cm 2 /C. Ou et al 202 synthesized tungsten (VI) Oxo-complexes of the type WO(OR) 3 L having partially fluorinated alkoxide and/or chelating ligands (Figure 6).…”
Section: Materials Advances Accepted Manuscriptmentioning
confidence: 99%
“…The films deposited on a common glass display remarkable EC performance with maximum coloration efficiency of 66 cm 2 /C. Ou et al 202 synthesized tungsten (VI) Oxo-complexes of the type WO(OR) 3 L having partially fluorinated alkoxide and/or chelating ligands (Figure 6).…”
Section: Materials Advances Accepted Manuscriptmentioning
confidence: 99%
“…Chelating alkoxide ligands can also be used to ensure monomer formation if the deposition process requires it. 210,239…”
Section: Precursor Design and Growth Criteria For Semiconductor Mater...mentioning
confidence: 99%
“…206 Fluorination of alkoxide ligands is an alternative strategy reported to increase molecular volatility due to the subsequent strong repulsion between complexes from the introduction of non-bonding p electrons on fluorine, reducing intermolecular interactions. [207][208][209][210] Fluoroalkoxides are also hydrophobic, providing additional stability against hydrolysis from atmospheric moisture. 207 While fluorinated ligands are sometimes reported in SSPs for fluorine-doped materials, 211 most commonly fluorinedoped tin oxide (FTO), 212,213 it is feasible to fabricate thin films without fluorine incorporation despite using fluorinated precursors.…”
Section: Deposition Requirementsmentioning
confidence: 99%
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“…Via filling processes include the W plug fill process, the Al plug fill process, and the Cu damascene fill process. In the W plug fill process, the CVD W process is applied in terms of filling [15,16]. It is essential to derive the optimum conditions of the via profile photo/etch integration process, the glue layer Ti, and the barrier metal TiN process to optimize the process.…”
Section: Introductionmentioning
confidence: 99%