Growth of the Bi-Sb superlattice

Abstract

Bi-Sb multilayered thin films described in the paper were produced by evaporation in a diffusion vacuum system. X-ray diffraction measurements were the main method of investigating the structure of the films. Depending on the substrate temperature during the preparation of the samples, different types of texture were observed: (110) or/and (111). The samples produced at 170 K (showing strong (110) texture) were subjected to a detailed scrutiny. Computer-simulated x-ray spectra based on a statistical model of the superlattice structure were applied in the analysis.

Influence of Interfacial Effects on X-ray Diffraction Spectra of the [GaAs]n[AlAs]mSuperlattices

“…These measurements are nondestructive and relatively simple but precise analysis of the spectra is difficult because we obtain a complicated image resulting from the influence of different stuctural parameters: average numbers of monolayers in the superlattice unit cell, fluctuations of these values, thickness of interdiffused region at the interface, the macroscopic uniformíty of the multilayer across the film, etc [2][3][4].…”

“…The computer-simulated (using a Monte-Carlo method) spectra based on a "statistical" model of the superlattice stucture are proposed in the analysis. Earlier, the author with coworkers had used succesfully the similar model prepared for studying polycrystalline metallic superlattices [2,4,10]. Figure 1 shows the concept of the model proposed for semiconductor superlattices.…”