Growth of Silicon Nanowires by Nanometer-Sized Tip Manipulation

Kizuka, Tokushi; Takatani, Yasuhiro

doi:10.1143/jjap.46.5706

Cited by 5 publications

(6 citation statements)

References 30 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Furthermore, atom‐sized specimens, obtained by pulling apart a substrate and an AFM tip coated with the same material have been created. In particular, Au, Cu, and Pd point contacts70–72 and silicon nanowires73, 74 have been tested. Additional mechanical measurements have been carried out, including filled carbon nanotubes68, 75–77 and ZnO nanowires 78.…”

Section: In‐situ Tem Experimental Methodsmentioning

confidence: 99%

Section: In‐situ Tem Experimental Methodsmentioning

confidence: 99%

“…The majority of these experiments were carried out in a STM/TEM configuration (see section 2.2.2) meaning that force was not measured; however, recently T. Kizuka and coworkers developed a TEM/AFM with real time measurement capabilities,70 which allows force measurements. With this setup they were able to test metallic and semiconducting specimens, specifically silicon wires of nanometer width,73, 74 and copper and palladium nanocontacts 71, 72. In terms of HRTEM, their last work is very insightful in the sense that several domains (grains), few atoms wide, were directly imaged and their evolution, as a function of strain, was imaged.…”

Section: Capabilities Of In‐situ Tem Applied To One‐dimensional Namentioning

confidence: 99%

See 2 more Smart Citations

In Situ TEM Electromechanical Testing of Nanowires and Nanotubes

Espinosa

Bernal

Filleter

2012

Small

View full text Add to dashboard Cite

The emergence of one-dimensional nanostructures as fundamental constituents of advanced materials and next-generation electronic and electromechanical devices has increased the need for their atomic-scale characterization. Given its spatial and temporal resolution, coupled with analytical capabilities, transmission electron microscopy (TEM) has been the technique of choice in performing atomic structure and defect characterization. A number of approaches have been recently developed to combine these capabilities with in-situ mechanical deformation and electrical characterization in the emerging field of in-situ TEM electromechanical testing. This has enabled researchers to establish unambiguous synthesis-structure-property relations for one-dimensional nanostructures. In this article, the development and latest advances of several in-situ TEM techniques to carry out mechanical and electromechanical testing of nanowires and nanotubes are reviewed. Through discussion of specific examples, it is shown how the merging of several microsystems and TEM has led to significant insights into the behavior of nanowires and nanotubes, underscoring the significant role in-situ techniques play in the development of novel nanoscale systems and materials.

show abstract

Section: In‐situ Tem Experimental Methodsmentioning

confidence: 99%

Section: In‐situ Tem Experimental Methodsmentioning

confidence: 99%

Section: Capabilities Of In‐situ Tem Applied To One‐dimensional Namentioning

confidence: 99%

See 1 more Smart Citation

In Situ TEM Electromechanical Testing of Nanowires and Nanotubes

Espinosa

Bernal

Filleter

2012

Small

View full text Add to dashboard Cite

show abstract

“…34,35,[46][47][48][49][50][51] HRTEM enables us to observe directly the atomic configuration of ASWs. 28,[41][42][43][44][45][52][53][54][55][56][57][58][59][60][61][62][63][64][65][66][67] However, ASWs observed by HRTEM have been restricted to less than five constituent atoms owing to instability. Therefore, the atomic configuration of longer stable ASWs and the relationship to their electrical and mechanical properties still remain open problems.…”

Section: Introductionmentioning

confidence: 99%

Atomic configuration and mechanical and electrical properties of stable gold wires of single-atom width

2008

Self Cite

View full text Add to dashboard Cite

The formation dynamics of stable gold ͑Au͒ wires of single-atom width during tensile deformation of the nanometer-sized Au contacts was observed in situ at room temperature by transmission electron microscopy. Simultaneously, force and conductance were measured using functions of scanning probe microscopy. The wires were extended to 2.7Ϯ 0.1 nm and the number of atoms was increased to 10; the average interatomic distance was 0.30Ϯ 0.02 nm. The duration of the observation of the wires exceeded 10 s. The results of the simultaneous observation of the atomic configuration, force, and conductance led to the conclusion that the stable Au wires observed in this study are complexed with light-element atoms. The constants of the mechanical properties of the individual wires, i.e., elastic limit, Young's modulus, and strength, were analyzed on the basis of stress-strain curves experimentally measured on an atomic scale. During elastic elongation, a force of 1.6Ϯ 0.7 nN acted on the Au wires with an elastic limit of 0.15-0.20. Young's modulus of single-atom-width Au wires was 47-116 GPa and strength was 8 -17 GPa, estimated using a cross-sectional area of 0.118 nm 2 , which is that of a single atom in bulk along ͗110͘. Using these mechanical constants, the average interatomic distance in stress-free wires was estimated to be 0.26Ϯ 0.02 nm. The histogram of conductances for the single-atom-width Au wires showed a peak at approximately 1G 0 ͑where G 0 =2e 2 / h, e being the charge of an electron and h Planck's constant͒ until the total number of atoms exceeds 5. For longer wires constructed of more than six atoms, the conductance decreased to less than 0.1G 0 .

show abstract

“…Using basically the same setup, larger contacts for different materials have also been studied. For example, the correlation between stress and electromigration for copper [132,133] and slip during tensile deformation of palladium [134] and silicon contacts [135,136] have been investigated.…”

Section: Atomic Scale Wiresmentioning

confidence: 99%

Combining Scanning Probe Microscopy and Transmission Electron Microscopy

Nafari¹,

Angenete²,

Svensson

et al. 2010

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

View full text Add to dashboard Cite

This chapter is a review of an in situ method where a scanning probe microscope (SPM) has been combined with a transmission electron microscope (TEM). By inserting a miniaturized SPM inside a TEM, a large set of open problems can be addressed and, perhaps more importantly, one may start to think about experiments in a new kind of laboratory, an in situ TEM probing laboratory, where the TEM is transformed from a microscope for still images to a real-time local probing tool. In this method, called TEMSPM, the TEM is used for imaging and analysis of a sample and SPM tip, while the SPM is used for probing of electrical and mechanical properties or for local manipulation of the sample. This chapter covers both instrumental and applicational aspects of TEMSPM. Abbreviations

show abstract

Growth of Silicon Nanowires by Nanometer-Sized Tip Manipulation

Cited by 5 publications

References 30 publications

In Situ TEM Electromechanical Testing of Nanowires and Nanotubes

In Situ TEM Electromechanical Testing of Nanowires and Nanotubes

Atomic configuration and mechanical and electrical properties of stable gold wires of single-atom width

Combining Scanning Probe Microscopy and Transmission Electron Microscopy

Contact Info

Product

Resources

About