2006
DOI: 10.1016/j.apsusc.2005.11.081
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Growth of Rh nanoclusters on TiO2(1 1 0): XPS and LEIS studies

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Cited by 69 publications
(40 citation statements)
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“…11. The Ti 2p emissions were symmetric; Ti 2p 3/2 appeared at 458.8 [192,193]. The spectral feature did not change significantly with time in an inert atmosphere (N 2 ).…”
Section: X-ray Photoelectron Spectroscopy (Xps)mentioning
confidence: 80%
See 1 more Smart Citation
“…11. The Ti 2p emissions were symmetric; Ti 2p 3/2 appeared at 458.8 [192,193]. The spectral feature did not change significantly with time in an inert atmosphere (N 2 ).…”
Section: X-ray Photoelectron Spectroscopy (Xps)mentioning
confidence: 80%
“…Rh clusters of controlled size can be prepared by physical vapor deposition (PVD) [192,306,307] and using Rh organometallic precursors [274,308] on TiO 2 (110) as well. However, STM [306,309], XPS and LEIS [192] experiments revealed that depending on the original cluster size and the evaporation temperature, the agglomeration of Rh nanoparticles can be significant even below 500 K on that surface. The relatively small cluster sizes obtained on titanate nanowires and nanotubes may indicate that the metal diffusion on these nanobjects is limited compared to that on well-ordered titania.…”
Section: 222mentioning
confidence: 99%
“…The first one was equipped with facilities for LEIS, AES, and XPS measurements (previously described in [23][24][25][26]), in the second one STM and AES techniques were used. Two similar TiO 2 (1 1 0) samples were cleaned and exposed to Au and Mo in the same way in the two UHV chambers.…”
Section: Methodsmentioning
confidence: 99%
“…XPS measurements were carried out with a constant 100 eV pass energy, at a take-off angle of 17°(with respect to surface normal) using an Al Ka X-ray anode. The binding energy scale was referenced to the position of the Ti2p emission for the stoichiometric clean oxide, set to 459.0 eV [9,13,26,32]. XP peaks were fitted using Gauss-Lorentz functions, after background subtraction (Shirley).…”
Section: Methodsmentioning
confidence: 99%
“…73 Encapsulation of Rh is well-documented on TiO 2 (110) above 700 K, as shown by XPS, LEIS and STM. 74,75 Partial covering by ceria was observed recently on the Rh-CeO 2 / MgO system by using the DRIFTS method. 71 Very recently, near ambient pressure X-ray photoelectron spectroscopy (nap-XPS) demonstrated that the strong metal support interaction effect (SMSI) found in the Ni-ceria system is associated with the decoration and burial of metallic particles by the partially reduced support.…”
Section: X-ray Photoelectron Spectroscopymentioning
confidence: 99%