Growth of Radiated Emission in Multi-Modular Systems

Ghosh, Kaustav; Zhang, Wei; Meiguni, Javad Soleiman; Patnaik, Abhishek; Pommerenke, David; Sochoux, Philippe; Rollin, Jacques; Li, Angela; Liu, Qian; Girish, M

doi:10.1109/temc.2019.2907455

Cited by 3 publications

(8 citation statements)

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“…Compared to the reviewed studies [5][6][7][8][9], the main advantages of the proposed method in the present paper are as follows:…”

Section: Introductionmentioning

confidence: 97%

“…However, the significant increase in electronic devices used nowadays might result in an increase in the overall noise floor and affect the immunity of neighboring devices and systems. As a result, the subject of the impact of an increasing number of devices on the overall emissions has attracted some attention recently [4][5][6][7][8][9], and it is currently being discussed within international standardization bodies (e.g., Comité International Spécial des Perturbations Radioélectriques (CISPR)). Understanding and quantifying such an impact are prerequisites to the proper evaluation of EMC of various electronic systems and devices and, if needed, to revisit international standards.…”

Section: Introductionmentioning

confidence: 99%

“…In [8], a method similar to that in [5] was used to evaluate the radiated emission of fully mounted intermodular networking equipment containing tens of nearly identical line cards and hundreds of optical modules. The results show that when the optical modules in one line card are operating at the same frequency, the total radiated field strength can be estimated by multiplying the radiation pattern of a single module by the array factor [10].…”

Section: Introductionmentioning

confidence: 99%

“…The shortcomings of the reviewed studies can be summarized as follows: (a) the same elements were used to model the multiple devices when calculating the radiated emissions [5][6][7][8]; (b) the same isotropic pattern was used to model each device's radiated emissions [5,6]; (c) all the sources were considered uncorrelated [5][6][7], so the power sum formula could have been used; (d) all the devices were located in a predefined 2D/3D regular grid, with a constant separation distance of 1 m between adjacent devices [6]; (e) the calculations were performed assuming a specific victim, namely, a vertical dipole located at the center of the volume [6]. It appears that published studies [5][6][7][8][9] on the topic at hand are largely based on simplifying assumptions, such as isotropic sources or predetermined placement of the devices.…”

Section: Introductionmentioning

confidence: 99%

“…The proposed method can estimate the far-field radiated emissions for a wide frequency range. In other words, the effect of the frequency can be included in the far-field estimations, unlike any of the previous approaches [5][6][7][8][9].…”

Section: Introductionmentioning

confidence: 99%

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EMC Impact of Disturbances Generated by Multiple Sources

et al. 2022

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In this paper, the impact of an increasing number of arbitrary electrical/electronic devices on the overall radiated emissions is investigated. Understanding and quantifying such an impact are prerequisites to the proper evaluation of electromagnetic compatibility (EMC) of various electronic systems and devices and, if needed, to revisiting the international standards. To evaluate the radiated emissions from multiple electronic devices, each arbitrary electronic device is characterized using an equivalent Huygens’s surface, in which the tangential components of electric and magnetic near fields are calculated (or measured). The radiated emission from the arbitrary electronic device can be calculated using the electric and magnetic near fields for an arbitrary phase (correlated or uncorrelated), position, and orientation. The influence of several parameters affecting the radiated emissions from multiple arbitrary electronic devices, including the number of disturbance sources, the polarization of each device, the radiation pattern of each device, the location and orientation of each device, and the phase shifts between devices, are analyzed. The numerical results show that the mentioned parameters have a significant effect on the radiated emissions, and cannot be neglected in EMC considerations. In general, increasing the number of electronic devices leads to an increase in the level of radiated emissions. However, the increase depends on other parameters such as the arrangement (the radiation pattern for each device, the distance between the devices, and the orientation and/or polarization of each device). The proposed method can be straightforwardly applied to devices characterized by near-field measurements or multimodular large equipment with long cables.

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“…Compared to the reviewed studies [5][6][7][8][9], the main advantages of the proposed method in the present paper are as follows:…”

Section: Introductionmentioning

confidence: 97%