2013
DOI: 10.1016/j.apsusc.2013.03.070
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Growth of preferentially c-axis oriented hydroxyapatite thin films on Si(1 0 0) substrate by electron-cyclotron-resonance plasma sputtering

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Cited by 17 publications
(17 citation statements)
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“…It is seen that solid-phase crystallization occurred at 550°C after 10 h of annealing. This threshold crystallization temperature coincides with the crystallization limit of HAp films deposited on Si [40,41] and sapphire [42]. In contrast, 2 h of annealing was sufficient to drive crystallization at 600°C.…”
Section: Methodsmentioning
confidence: 79%
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“…It is seen that solid-phase crystallization occurred at 550°C after 10 h of annealing. This threshold crystallization temperature coincides with the crystallization limit of HAp films deposited on Si [40,41] and sapphire [42]. In contrast, 2 h of annealing was sufficient to drive crystallization at 600°C.…”
Section: Methodsmentioning
confidence: 79%
“…The details on the ECR plasma sputtering apparatus and the optimum deposition conditions have been described in our previous papers [40,41]. Briefly, ECR plasma was generated by transmitting 2.45 GHz microwaves into the plasma source region.…”
Section: Methodsmentioning
confidence: 99%
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“…The water pressure range was between 10 -4 and 10 -1 Pa. A deposition rate was ~ 1.3 nm/min. Crack-free ACP deposits of 300 -500 nm thick with smooth morphologies were manufactured at room temperature, which were transformed into HA deposits after annealing in presence of oxygen [266]. However, crack-free HA deposits of high hardness and the specific crystallographic orientations were manufactured when Xe gas was used and Si (100) substrates were heated to 450 -500 °C from their rear [267].…”
Section: Accepted Manuscriptmentioning
confidence: 99%
“…A C C E P T E D M A N U S C R I P T ACCEPTED MANUSCRIPT 18 To sputter materials, several types of the techniques are used, such as: ion beam [216][217][218][219][220][221][222][223][224][225][226], radio-frequency (RF) magnetron [227-244k], pulsed laser [58,75,232,, electroncyclotron-resonance plasma [266][267][268], diode, direct current and reactive sputtering or deposition [269,270]. However, since CaPO 4 belong to the electrically insulating materials, the last three techniques cannot be used for their spattering.…”
Section: Vapor Deposition Techniquesmentioning
confidence: 99%