2010
DOI: 10.1039/c0nr00170h
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Growth of horizontally aligned single-walled carbon nanotubes on anisotropically etched silicon substrate

Abstract: Directional controllability of single-walled carbon nanotubes (SWNTs) is an important issue for future nanoelectronics applications. For direct integration of carbon nanotubes with modern electronics, aligned growth of carbon nanotubes on SiO(2)/Si is desirable. We developed a new method to horizontally align SWNTs directly on SiO(2)/Si substrate by creating trenches on Si(100) through anisotropic etching followed by thermal oxidation. The V-shaped trenches highly improved the alignment of SWNTs and the degree… Show more

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Cited by 18 publications
(12 citation statements)
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“…As shown in the Supplementary Information Figure S5, no shift in Si 2p peak has observed in trench structures made with conventional photolithography and etching process. The XPS results determinately highlight the difference between this work and the previous reports by Orofeo and colleagues1112. While the driving force for the alignment in the previous work is purely geometrical constriction, favorable atomic rearrangement was added to the geometrical constriction (that match with the size of SWNT) in case of scratch-induced alignment.…”
mentioning
confidence: 45%
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“…As shown in the Supplementary Information Figure S5, no shift in Si 2p peak has observed in trench structures made with conventional photolithography and etching process. The XPS results determinately highlight the difference between this work and the previous reports by Orofeo and colleagues1112. While the driving force for the alignment in the previous work is purely geometrical constriction, favorable atomic rearrangement was added to the geometrical constriction (that match with the size of SWNT) in case of scratch-induced alignment.…”
mentioning
confidence: 45%
“…Several attempts have been made to prepare aligned SWNTs on noncrystalline substrates. Aligned growth using external forces, such as electric fields or gas flows, has been demonstrated, and alignment using substrate modification techniques, such as lithographically patterned trenches, showed potential for success1112. However, a cost-effective method that permits the controlled growth of 1-D nanostructures on amorphous substrates is required for practical applications.…”
mentioning
confidence: 99%
“…Surface directed growth mode essentially relies on the anisotropic van der Waals interactions between SWNT and various surface structures of substrate, including the crystallographic lattice (Figure c), faceted nano‐steps (Figure e) and etched trenches . Accordingly, it can be divided into lattice directed and nano‐step directed growth modes, which are capable to prepare aligned SWNT arrays with high density.…”
Section: Orientation Controlmentioning
confidence: 99%
“…Vertical and horizontal alignment of CNTs is commonly attained by CVD techniques during synthesis 12,13 and by post-treatments. [14][15][16] Aligned MWCNTs using arc discharge under a controlled atmosphere of N 2 has been demonstrated. 17 The present work demonstrates in-situ synthesis of densely packed and * Author for correspondence (prathap@iitm.ac.in) horizontally aligned high-quality MWCNTs using the arc discharge method with the help of a metal scraper in an open air.…”
Section: Introductionmentioning
confidence: 99%