2004
DOI: 10.1016/j.jcrysgro.2004.07.020
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Growth of epitaxially twinned ferroelectric Bi3.25La0.75Ti3O12(028) thin film on GaN substrate

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Cited by 8 publications
(4 citation statements)
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“…This image confirms the grainy nature of the epitaxial BST film, where presumably the grains correspond to regions separated by in-plane rotational misorientation and 601 twinning. Such a microstructure is expected from the large FWHM value identified in the phi-circle and is consistent with other reports of oxide-GaN epitaxy [7,[9][10][11][12][13]. The lower panel in Fig.…”
Section: Resultssupporting
confidence: 91%
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“…This image confirms the grainy nature of the epitaxial BST film, where presumably the grains correspond to regions separated by in-plane rotational misorientation and 601 twinning. Such a microstructure is expected from the large FWHM value identified in the phi-circle and is consistent with other reports of oxide-GaN epitaxy [7,[9][10][11][12][13]. The lower panel in Fig.…”
Section: Resultssupporting
confidence: 91%
“…Though reports exist for the epitaxial integration of oxides with GaN, there are no current examples of abrupt epitaxial interfaces between GaN and ferroelectric oxides that are free from interfacial phases at the atomic scale [4,5,[7][8][9][10][11][12][13]. In this report, we demonstrate that GaN-barium strontium titanate interfaces can be prepared using straightforward deposition methods at high temperatures in the absence of interfacial chemical reactions.…”
Section: Introductionmentioning
confidence: 73%
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“…GaN has excellent intrinsic properties, such as chemical stability, high breakdown voltage, and good thermal conductivity, and can be used as the bottom electrode for many electronic devices. [6][7][8] Therefore, epitaxial n-GaN film grown on sapphire has been used as a transparent substrate and bottom electrode for the growth of GVO films.…”
Section: Introductionmentioning
confidence: 99%