2010
DOI: 10.1016/j.jcrysgro.2010.04.042
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Growth of epitaxial TmFeCuO4 thin films by pulsed laser deposition

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Cited by 8 publications
(9 citation statements)
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“…Various trivalent ions are selected as R ion in reported films: Lu, [18][19][20][21][22][23][24][25] Yb, [26][27][28] Tm 17 and In. 29 The change in R ions is unlikely to affect intrinsically as well as for bulk.…”
Section: Fabrication Of the Filmmentioning
confidence: 99%
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“…Various trivalent ions are selected as R ion in reported films: Lu, [18][19][20][21][22][23][24][25] Yb, [26][27][28] Tm 17 and In. 29 The change in R ions is unlikely to affect intrinsically as well as for bulk.…”
Section: Fabrication Of the Filmmentioning
confidence: 99%
“…29 The change in R ions is unlikely to affect intrinsically as well as for bulk. These films are fabricated on various substrates: Al 2 O 3 (001), 18,21,25,26,28 YSZ(111), 17,19,24,27 ZnO(001), 29 MgO(111), 20,22,23 MgAl2O4(111) 23 and 6H-SiC(001). 23 Also various deposition techniques are tried: pulsed laser deposition (PLD), 17,18,20,21,24,27,29 electron beam deposition (EB), 19,25,26 molecular beam epitaxy (MBE), 22,23 and rf magnetron sputtering.…”
Section: Fabrication Of the Filmmentioning
confidence: 99%
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