1984
DOI: 10.1049/el:19840259
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Growth of CuInS2 single crystals by THM

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Cited by 5 publications
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“…The electron mobility of 0.1 cm 2 V –1 s –1 is much lower than literature values, which range from 9 to 338 cm 2 V –1 s –1 . ,,,, Only in p-type CuInS 2 , made p-type by annealing in sulfur, a similarly low hole mobility of 0.1 cm 2 V –1 s –1 has been reported . Early on, nearly complete donor–acceptor self-compensation was speculated to cause electron localization, hence low mobility, with the residual donor defects being In Cu and V S .…”
Section: Discussionmentioning
confidence: 79%
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“…The electron mobility of 0.1 cm 2 V –1 s –1 is much lower than literature values, which range from 9 to 338 cm 2 V –1 s –1 . ,,,, Only in p-type CuInS 2 , made p-type by annealing in sulfur, a similarly low hole mobility of 0.1 cm 2 V –1 s –1 has been reported . Early on, nearly complete donor–acceptor self-compensation was speculated to cause electron localization, hence low mobility, with the residual donor defects being In Cu and V S .…”
Section: Discussionmentioning
confidence: 79%
“…The electrical resistivity at room temperature of 2.7 × 10 6 Ω·cm is high because of the low electron mobility and the low electron concentration of 2.3 × 10 13 cm –3 . High resistivities have been observed in as-grown crystals, ,, in crystals equilibrated with Zn (hence Cu-poor), and in thin films prepared without excess Cu. , As nanometer thick Cu-poor interphases cannot be detected by the routine XRD analysis typically employed in thin-film solar cell work, some of the highly resistive material of earlier studies also may have been stoichiometric CuInS 2 with interphase inclusions. With the reservation that the thermal activation energy of the electrical resistivity includes both electron density and mobility, the value measured here of 87 meV is compatible with the donor ionization energies identified in CuInS 2 , which range from 5 to 570 meV. , …”
Section: Discussionmentioning
confidence: 92%
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