Abstract:Continuous biaxially textured CdTe films were grown on biaxial CaF 2 buffer layers. The CaF 2 nanorods were grown by oblique angle vapor deposition and possessed a {111}h121i biaxial texture. The CdTe film was deposited by metal organic chemical vapor deposition (MOCVD). Film morphology and the CdTe/ CaF 2 interface were studied by scanning electron microscopy and transmission electron microscopy. Characterization showed that small CdTe grains formed initially from the CaF 2 surfaces. These small grains then m… Show more
“…Our previous work shows that CaF 2 nanorods grown by the oblique angle vapor deposition on amorphous substrates exhibit a biaxial texture [35,36]. This CaF 2 can be used as a buffer layer to grow biaxial thin films for various applications [6,7,9,10]. In Fig.…”
Section: Texture Evolution Of Caf 2 Nanorods -A Rheed Surface Pole Fimentioning
confidence: 97%
“…All these films were deposited using the oblique angle deposition (or inclined-substrate deposition) technique [37][38][39][40][41][42][43]. We have also applied the technique to measure the CdTe biaxial films grown on biaxial CaF 2 nanostructures deposited using the oblique angle deposition technique [9,10]. Oblique-angle deposition has been used to grow magnetic films with magnetic anisotropy [44], high reflectance mirrors for optics [37], and various nanostructures [38, 39, 41-43, 45, 46].…”
Section: Oblique Angle Deposition -A Strategy For Film Growth With Bimentioning
confidence: 99%
“…A recent example is the growth of biaxially textured films as buffer layers for subsequent growth of highly oriented (both out-of-plane and in-plane) high T c superconducting films to achieve high current density [5]. It has also been suggested that this approach can be extended to include the growth of biaxial semiconductor films on biaxially textured buffer layers on glass [6][7][8], amorphous substrates [9,10] and metal sheets [11,12] for efficient and inexpensive solar cell applications. Other potential applications include solid state lighting and optoelectronic devices.…”
The most frequently used characterization technique for biaxial texture formation in thin films is x-ray pole figure analysis. However, x-rays interact weakly with matter and can penetrate a few microns deep into the film. The texture obtained by x-rays is therefore an average texture from the entire thickness of the film. As the texture of a film often changes during growth, information on the basic mechanisms that control the final texture is often lost. In contrast electrons interact strongly with matter and they have very limited penetration and escape depths of a few nm. In this paper we will show how we can use our newly developed reflection high energy electron diffraction (RHEED) surface pole figure technique to probe the surface texture evolution of the growth front from the initial stage (nm thick) to the later stage. The RHEED pole figure technique is a surface-sensitive technique that allows us to obtain information on the dynamic behavior of texture evolution of the growth front during film deposition. We shall explain the principle, measurement, and construction of such RHEED surface pole figures. An example of the biaxial texture evolution of CaF 2 due to the atomic shadowing effect during oblique angle deposition is described.
“…Our previous work shows that CaF 2 nanorods grown by the oblique angle vapor deposition on amorphous substrates exhibit a biaxial texture [35,36]. This CaF 2 can be used as a buffer layer to grow biaxial thin films for various applications [6,7,9,10]. In Fig.…”
Section: Texture Evolution Of Caf 2 Nanorods -A Rheed Surface Pole Fimentioning
confidence: 97%
“…All these films were deposited using the oblique angle deposition (or inclined-substrate deposition) technique [37][38][39][40][41][42][43]. We have also applied the technique to measure the CdTe biaxial films grown on biaxial CaF 2 nanostructures deposited using the oblique angle deposition technique [9,10]. Oblique-angle deposition has been used to grow magnetic films with magnetic anisotropy [44], high reflectance mirrors for optics [37], and various nanostructures [38, 39, 41-43, 45, 46].…”
Section: Oblique Angle Deposition -A Strategy For Film Growth With Bimentioning
confidence: 99%
“…A recent example is the growth of biaxially textured films as buffer layers for subsequent growth of highly oriented (both out-of-plane and in-plane) high T c superconducting films to achieve high current density [5]. It has also been suggested that this approach can be extended to include the growth of biaxial semiconductor films on biaxially textured buffer layers on glass [6][7][8], amorphous substrates [9,10] and metal sheets [11,12] for efficient and inexpensive solar cell applications. Other potential applications include solid state lighting and optoelectronic devices.…”
The most frequently used characterization technique for biaxial texture formation in thin films is x-ray pole figure analysis. However, x-rays interact weakly with matter and can penetrate a few microns deep into the film. The texture obtained by x-rays is therefore an average texture from the entire thickness of the film. As the texture of a film often changes during growth, information on the basic mechanisms that control the final texture is often lost. In contrast electrons interact strongly with matter and they have very limited penetration and escape depths of a few nm. In this paper we will show how we can use our newly developed reflection high energy electron diffraction (RHEED) surface pole figure technique to probe the surface texture evolution of the growth front from the initial stage (nm thick) to the later stage. The RHEED pole figure technique is a surface-sensitive technique that allows us to obtain information on the dynamic behavior of texture evolution of the growth front during film deposition. We shall explain the principle, measurement, and construction of such RHEED surface pole figures. An example of the biaxial texture evolution of CaF 2 due to the atomic shadowing effect during oblique angle deposition is described.
“…Small angle grain boundary semiconductor films on non-single crystal substrate can be achieved by first creating a biaxial buffer layer followed by depositing the semiconductor film [10][11][12][13][14][15][16]. Biaxial buffer layers can be grown on non-single crystal substrates such as glass by a number of techniques including ion assisted deposition [10][11][12] and oblique angle deposition [13][14][15][16]. A biaxial film is not exactly a single crystal, but it has both preferred out-ofplane and in-plane orientations with small angle grain boundaries.…”
Section: The Quest For Small Angle Grain Boundary Semiconductor Filmsmentioning
confidence: 99%
“…An alternative and scalable method to produce biaxial buffer layers is the oblique angle deposition (or the inclined substrate deposition) technique where growth on large area can be achieved. The oblique angle deposition technique has been used to produce buffer layers such as MgO [18,19], as well as CeO 2 [12,13] and CaF 2 [14][15][16] to grow biaxial semiconductors. From the material point of view, CaF 2 buffer layers grown under normal incident vapor on single crystal Si substrates have been used extensively for the growth of single crystal semiconductor films such as CdTe and GaAs [20][21][22].…”
Section: Growth Techniques and Materials Choicesmentioning
High efficiency photovoltaic devices are normally fabricated on single crystalline substrates. These single crystalline substrates are expensive and volume production for widespread usage has not been realistic. To date, large volume production of solar cells is on less expensive non-crystalline substrates such as glass. Typically the films grown on glass are polycrystalline with less than ideal efficiency. It was proposed that a dramatic gain in the efficiency may be achieved if one uses a biaxially oriented buffer layer on glass to grow biaxial semiconductor films to fabricate solar devices compared to that of films grown directly on glass. Biaxial films are not exactly single crystal but have strongly preferred crystallographic orientations in both the out-of-plane and in-plane directions. Typically the misorientation between grains can be small (within a few degrees) and may possess low carrier recombination rate. In this paper we shall discuss growth techniques that would allow one to produce biaxial buffer layers on glass. A specific strategy using an atomic shadowing mechanism in an oblique angle deposition configuration that allows one to grow biaxial buffer layers such as CaF2on glass substrate will be discussed in detail. Results of heteroepitaxy of semiconductor materials such as CdTe and Ge on these biaxial buffer/glass substrates characterized by x-ray pole figure, reflection high energy electron diffraction (RHEED) pole figure and transmission electron microscopy (TEM) will be presented.
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