Growth Mode and Surface Structure of Cr Ultrathin Film on Fe/Cu(001)

Abstract

We hereby report a growth mode and surface structure of ultrathin Cr films on fcc Fe/Cu(001). We have found a clear RHEED intensity oscillation during Cr deposition up to four monolayers on 3 and 6 ML Fe/Cu(001), indicating an layer-by-layer growth. Besides, the observed (2×1) LEED pattern at low Cr thickness is similar to that of fcc Fe/Cu(001) in the 5-11 ML thickness range. We have also demonstrated the Cr/Fe multilayer growth with single monolayer of Cr inserted between fcc Fe layers.