2009
DOI: 10.1016/j.vacuum.2009.06.055
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Growth condition dependence of structural and electrical properties of Mg2Si layers grown on silicon substrates

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Cited by 30 publications
(24 citation statements)
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“…No orientation relationship is observed between Mg 2 Si and MgO. It has been reported that the significant excess of Mg flux in the growing layer degrades the crystalline quality [4].…”
Section: Fig 4: Tem Images and Corresponding Fft Patterns Of The Nanmentioning
confidence: 96%
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“…No orientation relationship is observed between Mg 2 Si and MgO. It has been reported that the significant excess of Mg flux in the growing layer degrades the crystalline quality [4].…”
Section: Fig 4: Tem Images and Corresponding Fft Patterns Of The Nanmentioning
confidence: 96%
“…• C [1][2][3][4]. Although Mg 2 Si possesses many significant advantages such as the high abundance and low toxicity of its constituent elements, it has lower ZT than the more common thermoelectric materials.…”
Section: Introductionmentioning
confidence: 99%
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“…Magnesium silicide (Mg 2 Si), having an anti-CaF 2 structure and a lattice constant of 0.6351 nm, was reported as a narrow-band-gap semiconductor with an indirect band gap of 0.6-0.8 eV [3]. It has been considered as an ecologically friendly n-type thermoelectric material due to the sufficiently abundant and environmentally harmless of its constituent elements.…”
mentioning
confidence: 99%
“…On the other hand, periodic Si nanorods have been successfully fabricated under monodispersed polystyrene nanospheres assisted. Because of the high diffusion coefficient of Mg in Mg 2 Si, the Mg 2 Si layers with a smooth Mg 2 Si/Si interface have been successfully grown by the exposure of Si substrates under Mg vapor [3].…”
mentioning
confidence: 99%