2008
DOI: 10.1016/j.mee.2007.07.004
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Growth and structural properties of crystalline LaAlO3 on Si (001)

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Cited by 21 publications
(8 citation statements)
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“…By exploiting the sensitivity of the ground state properties of the CMR manganites to charge, we showed that large, charge-driven, magnetoelectric coupling in PZT/LSMO multiferroic heterostructures can be achieved. The effect is electronic in origin, as demonstrated by advanced spectroscopic techniques, and is therefore compatible with current CMOS technology, in particular since the growth of crystalline oxides on Si(001) is now well established McKee et al (1998;; Reiner et al (2008). Further, we show that both the spin state and the magnetic configuration can be controlled electrostatically.…”
Section: Discussionsupporting
confidence: 69%
“…By exploiting the sensitivity of the ground state properties of the CMR manganites to charge, we showed that large, charge-driven, magnetoelectric coupling in PZT/LSMO multiferroic heterostructures can be achieved. The effect is electronic in origin, as demonstrated by advanced spectroscopic techniques, and is therefore compatible with current CMOS technology, in particular since the growth of crystalline oxides on Si(001) is now well established McKee et al (1998;; Reiner et al (2008). Further, we show that both the spin state and the magnetic configuration can be controlled electrostatically.…”
Section: Discussionsupporting
confidence: 69%
“…Because each layer in the AO (001) terminations of the A II B IV O3-type compounds (A = Ba, Sr, Pb; B = Ti, Zr) 52−56 is neutral, the repeat stacking of such layers results in a non-polar surface, and their insulating characteristics are thus reserved.For the AlO2 (001) termination, we can also observe a remarkable difference in the SDOSs(Figure 2b) from the bulk crystal(Figure 2d), i.e., a new peak above the Fermi level appears. The PDOSs(Figure 2b) further identified that the empty valence states originate mainly from the 2p contribution of the O atoms in the outmost layer 10. …”
mentioning
confidence: 83%
“…Figures 2a-c show variations of the composition that would be expected, assuming no atomic rearrangements, based on the layer-by-layer growth procedure from Refs. 24 . In Fig.…”
Section: Interface Structures and Compositionsmentioning
confidence: 99%