Growth and morphology of SnPc films on the S-GaAs(001) surface: a combined XPS, AFM and NEXAFS study

Vearey-Roberts, A. R.; Steiner, Hubert; Evans, Stephen D.; Cerrillo, I; Méndez, Javier; Cabailh, Gregory; O’Brien, S; Wells, Justin W.; McGovern, I.T.; Evans, D. A.

doi:10.1016/j.apsusc.2004.05.068

Cited by 32 publications

(23 citation statements)

References 15 publications

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“…It has recently been shown that the central metal atom in PcÕs plays also a role for the orientation. On the same sulfur-terminated GaAs(0 0 1) surface, SnPc molecules show a lying orientation in contrast to a standing orientation of CuPc molecules [5].…”

Section: Introductionmentioning

confidence: 98%

“…In particular, the orientation of the first layers, which may affect device properties considerably, can be monitored by near-edge X-ray absorption spectroscopy (XAS) [5,6,11,[13][14][15]. Alternatively, optical absorption spectroscopy can be used to determine the molecular orientation in thin films [21].…”

Section: Introductionmentioning

confidence: 99%

“…For the investigation of the chemical reactivity at interfaces X-ray photoelectron spectroscopy (XPS) is a suitable method. It was shown that interfaces between divalent MPcÕs and inorganic semiconductors often exhibit weak bonding even in the presence of dangling bonds on the inorganic semiconductor surfaces because of the closed-shell character of the MPcÕs molecules [1][2][3][4][5]. On the other hand, a strong chemical reaction was observed for MPcÕs on more reactive substrates, like CuPc/Al(0 0 1) [6], CuPc/indium tin oxide (ITO) [7], CuPc/Si(111) [1] and CuPcF 4 /Ag [8].…”

Section: Introductionmentioning

confidence: 99%

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Growth of zinc phthalocyanine onto ZnS film investigated by synchrotron radiation-excited X-ray photoelectron and near-edge absorption spectroscopy

et al. 2005

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Section: Introductionmentioning

confidence: 98%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Growth of zinc phthalocyanine onto ZnS film investigated by synchrotron radiation-excited X-ray photoelectron and near-edge absorption spectroscopy

et al. 2005

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“…12 We note that on various differently prepared semiconductor surfaces different orientations of Pcs were observed. 15,16 Recently, it also was found that the substrate roughness significantly affects the orientation of Pcs, i.e., PcCu molecules lie on flat, single crystalline substrates and they stand on rough substrates. 14 A roughness higher than the molecule size causes a weakened substrate-molecule interaction, consequently a "standing" adsorption geometry is favorable.…”

Section: B Molecular Orientationmentioning

confidence: 98%

“…[7][8][9] Especially for Pcs a very high degree of orientation in evaporated films was observed on several substrates. [10][11][12][13][14][15][16] On the other hand, oriented organic films can be also prepared from solutions by self-assembling 17 or by Langmuir-Blodgett techniques, 18 or even by spin coating. 19 Such preparations offer a new route for a very low-cost production of thin oriented films.…”

Section: Introductionmentioning

confidence: 99%

Tetra-t-butyl magnesium phthalocyanine on gold: Electronic structure and molecular orientation

Biswas

Peisert

Schwieger

et al. 2005

The Journal of Chemical Physics

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In this work we have investigated the electronic structure and the molecular orientation of (t-Bu)(4)PcMg (tetra-t-butyl magnesium phthalocyanine) on polycrystalline and single crystalline gold substrates using photoemission spectroscopy and x-ray absorption spectroscopy, and we compare the results to the unsubstituted PcCu (copper phthalocyanine). The C 1s photoemission spectrum is described similar to unsubstituted relatives with an additional component for the aliphatic substituents. The variation of the excitation energy causes distinct differences in the shape of the C 1s spectrum, which is very useful for the analysis of the molecular orientation in the uppermost layer. It is shown that despite of the sterically demanding substituents, ordered sublimed films of (t-Bu)(4)PcMg are accessible, the orientation of the molecules, however, is different from the orientation of the unsubstituted relatives.

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Probing the Roughness of Porphyrin Thin Films with X‐ray Photoelectron Spectroscopy

et al. 2020

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Thin-film growth of molecular systems is of interest for many applications, such as for instance organic electronics. In this study, we demonstrate how X-ray photoelectron spectroscopy (XPS) can be used to study the growth behavior of such molecular systems. In XPS, coverages are often calculated assuming a uniform thickness across a surface. This results in an error for rough films, and the magnitude of this error depends on the kinetic energy of the photoelectrons analyzed. We have used this kinetic-energy dependency to estimate the roughnesses of thin porphyrin films grown on rutile TiO 2 (110). We used two different molecules: cobalt (II) monocarboxyphenyl-10,15,20-triphenylporphyrin (CoMCTPP), with carboxylic-acid anchor groups, and cobalt (II) tetraphenylporphyrin (CoTPP), without anchor groups. We find CoMCTPP to grow as rough films at room temperature across the studied coverage range, whereas for CoTPP the first two layers remain smooth and even; depositing additional CoTPP results in rough films. Although, XPS is not a common technique for measuring roughness, it is fast and provides information of both roughness and thickness in one measurement.

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Growth and morphology of SnPc films on the S-GaAs(001) surface: a combined XPS, AFM and NEXAFS study

Cited by 32 publications

References 15 publications

Growth of zinc phthalocyanine onto ZnS film investigated by synchrotron radiation-excited X-ray photoelectron and near-edge absorption spectroscopy

Growth of zinc phthalocyanine onto ZnS film investigated by synchrotron radiation-excited X-ray photoelectron and near-edge absorption spectroscopy

Tetra-t-butyl magnesium phthalocyanine on gold: Electronic structure and molecular orientation

Probing the Roughness of Porphyrin Thin Films with X‐ray Photoelectron Spectroscopy

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