Growth and magnetism of metallic thin films and multilayers by pulsed-laser deposition

Shen, Jian; Gai, Zheng; Kirschner, J.

doi:10.1016/j.surfrep.2003.10.001

Cited by 141 publications

(92 citation statements)

References 157 publications

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“…Nevertheless, the structurally identical Fe films, grown on Pd/Cu(0 0 1) and Cu(0 0 1), magnetically behave differently. Above 4 ML, the Fe films on Cu(0 0 1) experience a structural transformation, and the Kerr signal loses its linear dependence on thickness [6]. Below 1.6 ML, an increased in-plane signal with the reversed MOKE loops is detected when the film is grown on Fe/Pd/Cu(0 0 1) (Fig.…”

Section: Article In Pressmentioning

confidence: 93%

Structure and magnetism of ultrathin Co and Fe films epitaxially grown on Pd/Cu(001)

Przybylski

Liang³

et al. 2005

Journal of Magnetism and Magnetic Materials

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Section: Article In Pressmentioning

confidence: 93%

Structure and magnetism of ultrathin Co and Fe films epitaxially grown on Pd/Cu(001)

Przybylski

Liang³

et al. 2005

Journal of Magnetism and Magnetic Materials

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“…39,40 In the bottom panel of Fig. 1, we show XRR curves and their corresponding best fits for both epitaxial and polycrystalline series of samples [Figs.…”

Section: A Structure and Morphologymentioning

confidence: 99%

Magneto-optical and magnetoplasmonic properties of epitaxial and polycrystalline Au/Fe/Au trilayers

et al. 2011

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A complete study of the magneto-optical (MO) and magnetoplasmonic properties of both epitaxial and polycrystalline Au/Fe/Au multilayers as a function of Fe thickness is reported. An increase for both the MO activity without surface-plasmon-polariton (SPP) excitation and the magnetic modulation of the SPP wave vector for epitaxial structures compared to the polycrystalline ones is observed. This difference is related with the larger interface roughness of the polycrystalline structures that as a consequence, exhibit a reduction in the Fe MO constants. A comparative study of the MO activity with SPP excitation for both epitaxial and polycrystalline structures is also presented, being the key factor in the deposition of the adequate layer thickness to achieve optimum SPP excitation with independence of their crystalline nature.

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“…Additionally, atomic-scale oxide thin-films and heterostructures grown by PLD are shown to be comparable to samples grown by Molecular Beam Epitaxy (MBE). 7 Reflection high-energy electron diffraction (RHEED) has been successfully used to monitor the film growth in real-time by measuring the structural reconstruction and number of unit-cell layers. 8,9 However, the requirement of low-pressure operation and its inability to assess a material's electronic structure are a few shortcomings of RHEED.…”

Section: Introductionmentioning

confidence: 99%

Pulsed laser deposition with simultaneous in situ real-time monitoring of optical spectroscopic ellipsometry and reflection high-energy electron diffraction

Gruenewald

Nichols

Seo

2013

Review of Scientific Instruments

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We present a pulsed laser deposition (PLD) system that can monitor growth by simultaneously using in situ optical spectroscopic ellipsometry (SE) and reflection highenergy electron diffraction (RHEED). The RHEED precisely monitors the number of thin-film layers and surface structure during the deposition and the SE measures the optical spectra of the samples simultaneously. The thin-film thickness information obtained from RHEED facilitates the SE modeling process, which allows extracting the in situ optical spectra, i.e. the dielectric functions, of thin-films during growth. The in situ dielectric functions contain indispensable information about the electronic structure of thin-films. We demonstrate the performance of this system by growing LaMnO 3+δ (LMO) thin-films on SrTiO 3 (001) substrates. By using in situ SE and RHEED simultaneously, we show that real-time thickness and dielectric functions of the LMO thin-films can be effectively extracted. The simultaneous monitoring of both optical SE and RHEED offers important clues to understand the growth mechanism of atomic-scale thin-films. a)

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Growth and magnetism of metallic thin films and multilayers by pulsed-laser deposition

Cited by 141 publications

References 157 publications

Structure and magnetism of ultrathin Co and Fe films epitaxially grown on Pd/Cu(001)

Structure and magnetism of ultrathin Co and Fe films epitaxially grown on Pd/Cu(001)

Magneto-optical and magnetoplasmonic properties of epitaxial and polycrystalline Au/Fe/Au trilayers

Pulsed laser deposition with simultaneous in situ real-time monitoring of optical spectroscopic ellipsometry and reflection high-energy electron diffraction

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