Growth and Field Electron Emission Properties of Nano-Structured White Carbon Films

Abstract

Nano-structured white carbon films were synthesized by microwave plasma chemical vapor deposition. The x-ray diffraction line at 2 0 =21.60 (d=0.4107nm) corresponds to the (110) facet of a modifications of white carbon. The peak position at 283.46 eV in x-ray photoelectron spectrum represents binding energy of Cls core level of spl-hybridization of carbon. Field electron emission characteristics of the tilm were tested.