Growth and Decay Kinetics of Radiation-Induced Attenuation in Bulk Optical Materials

Girard, Sylvain; Allanche, Timothé; Paillet, Philippe; Goiffon, Vincent; Uffelen, Marco Van; Mont-Casellas, Laura; Muller, Cyprien; Boukenter, Aziz; Ouerdane, Y.; Cock, Wouter De

doi:10.1109/tns.2017.2778318

Cited by 22 publications

(6 citation statements)

References 10 publications

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“…Despite SPHERE's limitation, JWST should be able to detect a sub-Jovian planet with its expected high sensitivity at thermal IR. To quantify this, we simulated a 1 h integration with the JWST Mid-Infrared Instrument (MIRI) 15 µm coronagraphy mode using PANCAKE 2 (Van Gorkom et al 2016;Schneider et al 2016;Perrin et al 2018;Girard et al 2018;Carter et al 2020), which is based on the official JWST ETC Pandeia (Pontoppidan et al 2016). We then extracted a contrast curve from this simulated observation, which we then used to produce a planet mass versus semimajor axis detectability map, as shown in Fig.…”

Section: Probability Of Detecting Additional Companionsmentioning

confidence: 99%

The HD 206893 planetary system seen with VLT/SPHERE. Upper limit on the dust albedo and constraints on additional companions

Romero

Milli

Lagrange

et al. 2021

A&A

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Context. The detection and characterization of planets and debris disks is a very active field in current research. The F5V star HD 206893 hosts a ~25 MJup brown dwarf detected at ~10 au in VLT/SPHERE high-contrast images. This system is also known to host a debris disk, which is inferred from its high infrared excess. This disk was recently resolved in thermal submillimeter imaging with ALMA and extends from 30 to 180 au, with a ~27 au wide gap at ~74 au. Aims. Our goal is to search for the scattered light emission of the disk using the largest amount of SPHERE imaging data available to date. We also want to bring tighter constraints on the presence of additional low-mass companions based on the available multi-epoch high-contrast imaging data. Methods. We analyzed six epochs of SPHERE near-infrared data, processed with angular, polarimetric, and reference differential imaging, in order to detect the disk around HD 206893. Results. We do not detect the debris disk. Based on recent constraints on the disk morphology from ALMA data, this non-detection is compatible with a maximum albedo of 0.55 in the H band and 0.96 in the K band. Furthermore, we do not detect additional low-mass companions in the system. A low-mass companion is expected from radial velocity and astrometric measurements between 1.4 and 2.6 au, and we estimate our probability of detection higher than 90% for brown dwarfs more massive than 55 MJup in this separation range. At 74 au, where a gap is detected in the disk in thermal imaging, this probability of detection corresponds to planets above 2.5 MJup. Conclusions. The non-detection of the disk through the methods used in this study should not exclude an attempt with other techniques, such as advanced reference-star differential imaging using machine-learning-based libraries or star hopping. Furthermore, the future JWST instrument NIRCam might offer the possibility of detecting the disk in scattered light thanks to its increased sensitivity.

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Section: Probability Of Detecting Additional Companionsmentioning

confidence: 99%

The HD 206893 planetary system seen with VLT/SPHERE. Upper limit on the dust albedo and constraints on additional companions

Romero

Milli

Lagrange

et al. 2021

A&A

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“…Obviously, the doping of core or cladding to increase or decrease the refractive index is the most common. Doping has not only the role of modifying the refractive index, but it can also modify other optical features of the silica, and it is used to produce specific fibers for different applications [6][7][8][9][10][11][12]. Many chemical elements have been used to dope silica, from sensor applications to laser or amplifier manufacturing [6][7][8][9].…”

Section: Advantages and Disadvantages Of The Radiation-induced Attenumentioning

confidence: 99%

“…Silica (amorphous SiO 2 ) is a widely employed material in microelectronics and optoelectronics. It is present in MOS (metal-oxide-semiconductor) and SOI (silicon-on-insulator) technologies [1][2][3][4][5], see Figure 1a,b for their basic representations; it is the basic material of optical fibers [5][6][7][8][9][10] (Figure 1c illustrates a basic representation of an optical fiber) and of several bulk systems as lenses and mirrors [6,11,12]. Furthermore, nanocomposite materials containing silica have been proposed for different applications [13][14][15][16]; Figure 1d illustrates a scheme of pure silica non-porous nanoparticles and its features.…”

Section: Introductionmentioning

confidence: 99%

The Relevance of Point Defects in Studying Silica-Based Materials from Bulk to Nanosystems

et al. 2019

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The macroscopic properties of silica can be modified by the presence of local microscopic modifications at the scale of the basic molecular units (point defects). Such defects can be generated during the production of glass, devices, or by the environments where the latter have to operate, impacting on the devices’ performance. For these reasons, the identification of defects, their generation processes, and the knowledge of their electrical and optical features are relevant for microelectronics and optoelectronics. The aim of this manuscript is to report some examples of how defects can be generated, how they can impact device performance, and how a defect species or a physical phenomenon that is a disadvantage in some fields can be used as an advantage in others.

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“…The formation of defects on the surface of crystals when exposed to atomic particles has always been of interest to researchers due to the widespread use of these materials in surface engineering, 1–3 optoelectronics, 4–9 photovoltaics 10–13 space materials science, 14,15 and other fields of science and technology 8,16–20 . Today, high‐tech materials, in contrast to bulk materials, have special surface properties with special performance characteristics 21,22 . Investigation of the processes of modification of the surface properties of materials by bombardment with electrons and ions is one of the most important areas of materials science 23–26 .…”

Section: Introductionmentioning

confidence: 99%

Influence of the irradiation of ions of different mass on the formation of surface defects of lithium fluoride thin films

Sharopov

Kaur

Kurbanov

et al. 2022

Surface & Interface Analysis

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We explore the experimental and simulation results of the formation of defects on the surface of lithium fluoride thin films under irradiation with different mass ions using total current (TC) spectroscopy, secondary ion mass spectroscopy (SIMS), and the Stopping and Range of Ions in Matter (SRIM) software package. A comparative study was carried out with ions of different masses, and inconsistencies in the occurring physical phenomena between our early concepts were found. It is shown that in the case of heavy ions irradiation, they are implanted and appear as substitutional atoms into the bulk of the crystal. For ions with the smallest ion mass, the distribution of interstitial defects is greater on the surface than in the bulk of the crystal. An attempt is made to explain the formation of some defects on the surface (formed peaks in the TC spectra) by the method of computer simulation.

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Growth and Decay Kinetics of Radiation-Induced Attenuation in Bulk Optical Materials

Cited by 22 publications

References 10 publications

The HD 206893 planetary system seen with VLT/SPHERE. Upper limit on the dust albedo and constraints on additional companions

The HD 206893 planetary system seen with VLT/SPHERE. Upper limit on the dust albedo and constraints on additional companions

The Relevance of Point Defects in Studying Silica-Based Materials from Bulk to Nanosystems

Influence of the irradiation of ions of different mass on the formation of surface defects of lithium fluoride thin films

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