2023
DOI: 10.1039/d3ce00052d
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Growth and characterization of the β-Ga2O3 (011) plane without line-shaped defects

Abstract: A kind of dislocations occurring on the surface of β-Ga2O3 (001) substrate and line-shaped defects caused by these dislocations in the epitaxial layer are responsible for reverse leakage current and...

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Cited by 5 publications
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